Study of image sticking of LC cell with dielectric spectrum

Yi Lin Tsai, Ying Guey Fuhv, Chun Ying Huang, Ching Yu Chen, Chi-Yen Huang

研究成果: Conference contribution

摘要

We investigate dielectric spectrum (DS) of the LC ceils. The DS of the cell shift to the low frequency region during DC voltage stress (DCVS), and restores to the on'ginal position after DCVS. The cell with image sticking restore slower than that of the cell without image sticking.

原文English
主出版物標題23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016
發行者Society for Information Display
頁面670-672
頁數3
ISBN(電子)9781510845510
出版狀態Published - 2016 一月 1
事件23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016 - Fukuoka, Japan
持續時間: 2016 十二月 72016 十二月 9

出版系列

名字23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016
2

Other

Other23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016
國家Japan
城市Fukuoka
期間16-12-0716-12-09

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Human-Computer Interaction
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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  • 引用此

    Tsai, Y. L., Fuhv, Y. G., Huang, C. Y., Chen, C. Y., & Huang, C-Y. (2016). Study of image sticking of LC cell with dielectric spectrum. 於 23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016 (頁 670-672). (23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016; 卷 2). Society for Information Display.