摘要
We investigate dielectric spectrum (DS) of the LC ceils. The DS of the cell shift to the low frequency region during DC voltage stress (DCVS), and restores to the on'ginal position after DCVS. The cell with image sticking restore slower than that of the cell without image sticking.
| 原文 | English |
|---|---|
| 主出版物標題 | 23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016 |
| 發行者 | Society for Information Display |
| 頁面 | 670-672 |
| 頁數 | 3 |
| ISBN（電子） | 9781510845510 |
| 出版狀態 | Published - 2016 一月 1 |
| 事件 | 23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016 - Fukuoka, Japan 持續時間: 2016 十二月 7 → 2016 十二月 9 |
出版系列
| 名字 | 23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016 |
|---|---|
| 卷 | 2 |
Other
| Other | 23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016 |
|---|---|
| 國家 | Japan |
| 城市 | Fukuoka |
| 期間 | 16-12-07 → 16-12-09 |
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Human-Computer Interaction
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
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引用此
Tsai, Y. L., Fuhv, Y. G., Huang, C. Y., Chen, C. Y., & Huang, C-Y. (2016). Study of image sticking of LC cell with dielectric spectrum. 於 23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016 (頁 670-672). (23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016; 卷 2). Society for Information Display.