Soft X-Ray Photoemission Electron Microscopy Station with Polarized Radiation

D. H. Wei, Y. J. Hsu, G. C. Yin, Y. S. Wu, S. C. Chuang, K. L. Tsang, J. Y. Ou, J. C. Wu

研究成果: Conference contribution

摘要

We have established a soft x-ray photoemission electron microscopy station at BL05B elliptically polarized undulator beamline, which provides an average photon flux of 1× 1012 photons/sec in energies from 60 to 1400 eV with an resolving power of greater than 100000. Combination of the variable polarization and high brightness photon source makes the microscopy station powerful enough to spatially resolve the absorption anisotropy in micrometer sized area. We present some of the commission results to show the element-specific magnetic domain images and contrast enhancement by the polarized photon source.

原文English
主出版物標題Synchrotron Radiation Instrumentation
主出版物子標題8th International Conference on Synchrotron Radiation Instrumentation
發行者American Institute of Physics Inc.
頁面905-908
頁數4
ISBN(電子)0735401799
DOIs
出版狀態Published - 2004 五月 12
事件8th International Conference on Synchrotron Radiation Instrumentation - San Francisco, United States
持續時間: 2003 八月 252003 八月 29

出版系列

名字AIP Conference Proceedings
705
ISSN(列印)0094-243X
ISSN(電子)1551-7616

Other

Other8th International Conference on Synchrotron Radiation Instrumentation
國家United States
城市San Francisco
期間03-08-2503-08-29

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

指紋 深入研究「Soft X-Ray Photoemission Electron Microscopy Station with Polarized Radiation」主題。共同形成了獨特的指紋。

  • 引用此

    Wei, D. H., Hsu, Y. J., Yin, G. C., Wu, Y. S., Chuang, S. C., Tsang, K. L., Ou, J. Y., & Wu, J. C. (2004). Soft X-Ray Photoemission Electron Microscopy Station with Polarized Radiation. 於 Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation (頁 905-908). (AIP Conference Proceedings; 卷 705). American Institute of Physics Inc.. https://doi.org/10.1063/1.1757942