Simple method for measuring small wavelength differences

Jiun You Lin, Kun Huang Chen, Jing Heng Chen

研究成果: Article同行評審

3 引文 斯高帕斯(Scopus)

摘要

A simple method is presented to determine small wavelength differences based on the dispersion properties of a uniaxial crystal and circularly polarized heterodyne interferometry. A circularly polarized heterodyne light beam is incident on a uniaxial crystal at the Brewster's angle, and the reflected light beam passes through an analyzer for interference. Owing to proper azimuth angles of the transmission axis of the analyzer and the optical axis of the crystal, the variation of the phase difference determined with the heterodyne interferometric technique of the interference signal is significantly enhanced, resulting in an accurate wavelength variation. The feasibility of this method was demonstrated, and the sensitivity of wavelength differences is about 0.001 nm. The proposed approach has a simple structure, straightforward operation, high stability, and high sensitivity.

原文English
文章編號113605
期刊Optical Engineering
46
發行號11
DOIs
出版狀態Published - 2007 十二月 10

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

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