Reliability tests of a RFID-based lock for power meter applications

Kuan-Jung Chung, Chian Wei Jan, Chih Cheng Chen, Sen Chou Tsai

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

摘要

A novel lock (seal), combined Radio Frequency Identification (RFID) techniques with a smart mechanism, has been developed to improve the anti-thief ability of the traditional mechanical lock (seal) and RFID-based one that we developed in previous work. The reliability validation tests present that RFID locks past all required test conditions including mechanical and environmental tests to demonstrate that RFID is suitable for the defined conditions in use. Furthermore, a thermal cycling test was performed to evaluate the Lifetimes of RFID-based locks. Norris-Landzberg accelerated life model is applied. The results show that the mean life of RFID locks is longer than the required 5 years, and there are 24 RFID locks to fail among 5 years when employing 1 million of them in the market.

原文English
主出版物標題Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012
頁面945-948
頁數4
DOIs
出版狀態Published - 2012 七月 30
事件2012 International Symposium on Computer, Consumer and Control, IS3C 2012 - Taichung, Taiwan
持續時間: 2012 六月 42012 六月 6

出版系列

名字Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012

Other

Other2012 International Symposium on Computer, Consumer and Control, IS3C 2012
國家Taiwan
城市Taichung
期間12-06-0412-06-06

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications

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