Probing the Magnetization Reversal of Microstructured Permalloy Cross by Planar Hall Measurement and Magnetic Force Microscopy

Y. C. Chang, C. C. Chang, J. C. Wu, Z. H. Wei, M. F. Lai, C. R. Chang

研究成果: Article

2 引文 斯高帕斯(Scopus)

摘要

A local magnetization reversal of Permalloy cross has been studied by using magnetoresistance measurement and magnetic force microscope. An extraordinary change of the transverse voltage correlated with the planar Hall Effect was presented and evidenced by a series of MFM images which indicates that the rotation of magnetization within the joint area contributes to the significant voltage alteration.

原文English
頁(從 - 到)2963-2965
頁數3
期刊IEEE Transactions on Magnetics
42
發行號10
DOIs
出版狀態Published - 2006 十月

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

指紋 深入研究「Probing the Magnetization Reversal of Microstructured Permalloy Cross by Planar Hall Measurement and Magnetic Force Microscopy」主題。共同形成了獨特的指紋。

  • 引用此