跳至主導覽
跳至搜尋
跳過主要內容
English
中文
首頁
概要
研究單位
專案
研究成果
按專業知識、姓名或所屬機構搜尋
Multi-objectives exception management model for semiconductor back-end environment under turnkey service
R. S. Guo, D. M. Chiang,
F. Y. Pai
企業管理學系
研究成果
:
Article
›
同行評審
8
引文 斯高帕斯(Scopus)
總覽
指紋
指紋
深入研究「Multi-objectives exception management model for semiconductor back-end environment under turnkey service」主題。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Business & Economics
Semiconductors
Management Model
Factory
Due Dates
Throughput
Cycle Time
Compromise
Customer Satisfaction
Delivery Performance
Performance
Performance Index
Semiconductor Industry
Delivery Time
Critical Factors
Simulation Model
Performance Measures
Uncertainty
Deviation
Simulation
Experiment
Integrated
Engineering & Materials Science
Semiconductor materials
Industrial plants
Throughput
Customer satisfaction
Uncertainty
Industry
Experiments