Multi-objectives exception management model for semiconductor back-end environment under turnkey service

R. S. Guo, D. M. Chiang, F. Y. Pai

研究成果: Article同行評審

8 引文 斯高帕斯(Scopus)

摘要

On-time delivery is the need for customer satisfaction which is a critical factor in the survival of the semiconductor industry. The on-time-delivery performance of the whole semiconductor turnkey service depends on the performance of the back-end factories. Unfortunately, undesirable and inevitable production variations make it difficult to maintain and improve a factory's performance and more objectives such as cycle time, throughput rate and the due-date accuracy need to be simultaneously considered. This paper presents an exception management model in order to compromise the contradicting needs of delivery accuracy, throughput rate and cycle time. The exception model can be divided into three parts: (1) an integrated performance index is proposed to compromise multiple performance measures; (2) an AWDL (available WIP deviation level) determination model is designed to gather proper AWDLs for triggering exceptions and (3) a WIP correction action is proposed to make abnormal WIP levels back to normal levels as soon as possible. To evaluate the proposed WIP exception management model, a simulation model is constructed and experiments are then conducted. The simulation results show that the proposed model helps back-end factories to set proper exception triggering conditions, reduce uncertainty occurrences and achieve better performances on due dates.

原文English
頁(從 - 到)203-216
頁數14
期刊Production Planning and Control
18
發行號3
DOIs
出版狀態Published - 2007 四月 1

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Strategy and Management
  • Management Science and Operations Research
  • Industrial and Manufacturing Engineering

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