Magnetic domain configurations of microstructured permalloy exchange coupled by an antiferromagnetic (NiO) thin film is presented. NiO/NiFe bilayer micrometer array elements were fabricated using electron beam lithography through a lift-off technique. The magnetic force microscopy images of the elliptical and rectangular elements with various aspect ratios showed dipole-like magnetic domain structures. The bright/dark arc contrast associated with the magnetic pole strength was dependent on the anisotropic exchange field. Furthermore, the shape anisotropy can overwhelm anisotropic exchange in patterned elements with a high aspect ratio and thicker permalloy film.
|頁（從 - 到）||4948-4950|
|期刊||Journal of Applied Physics|
|出版狀態||Published - 2000 五月|
|事件||44th Annual Conference on Magnetism and Magnetic Materials - San Jose, CA, United States|
持續時間: 1999 十一月 15 → 1999 十一月 18
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)