TY - JOUR
T1 - Measuring physical parameters with surface plasmon resonance heterodyne interferometry
AU - Chen, Kun Huang
AU - Lin, Jiun You
AU - Chen, Jing Heng
PY - 2009/1/1
Y1 - 2009/1/1
N2 - If the incident angle of a light beam on the boundary surface between the thin metal film of a surface plasmon resonance (SPR) apparatus and a test medium is equal to or very near the resonant angle, then the phase difference between the p- and s-polarizations of the reflected light is related to the associated physical parameter. The phase difference can be measured accurately with heterodyne interferometry. If the relationship between the phase difference and the associated physical parameter is specified, then the associated physical parameter can be estimated from the phase difference data. This method has the benefits of both common-path interferometry and heterodyne interferometry, such as simple structure, high stability, high resolution, easy operation, and rapid real-time measurement.
AB - If the incident angle of a light beam on the boundary surface between the thin metal film of a surface plasmon resonance (SPR) apparatus and a test medium is equal to or very near the resonant angle, then the phase difference between the p- and s-polarizations of the reflected light is related to the associated physical parameter. The phase difference can be measured accurately with heterodyne interferometry. If the relationship between the phase difference and the associated physical parameter is specified, then the associated physical parameter can be estimated from the phase difference data. This method has the benefits of both common-path interferometry and heterodyne interferometry, such as simple structure, high stability, high resolution, easy operation, and rapid real-time measurement.
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U2 - 10.1016/j.ijleo.2007.06.008
DO - 10.1016/j.ijleo.2007.06.008
M3 - Article
AN - SCOPUS:56049095515
VL - 120
SP - 29
EP - 34
JO - Optik
JF - Optik
SN - 0030-4026
IS - 1
ER -