Investigation of electronic transport in lateral NiFe/Al2 O 3 /p-Si/Al2 O3 /NiFe junctions

Y. C. Lee, C. W. Lin, H. M. Lee, L. Horng, J. C. Wu

研究成果: Article

指紋 深入研究「Investigation of electronic transport in lateral NiFe/Al<sub>2</sub> O <sub>3</sub> /p-Si/Al<sub>2</sub> O<sub>3</sub> /NiFe junctions」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science