In-situ investigation of patterned magnetic domain structures using magnetic force microscope

J. C. Wu, Y. W. Huang, H. W. Huang, Te ho Wu

研究成果: Conference article同行評審

摘要

The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).

原文English
頁(從 - 到)GP-12
期刊Digests of the Intermag Conference
出版狀態Published - 1999 十二月 1
事件Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea
持續時間: 1999 五月 181999 五月 21

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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