In-situ investigation of patterned magnetic domain structures using magnetic force microscope

J. C. Wu; Y. W. Huang; H. W. Huang; Te ho Wu

In-situ investigation of patterned magnetic domain structures using magnetic force microscope

J. C. Wu, Y. W. Huang, H. W. Huang, Te ho Wu

物理學系

研究成果: Conference article › 同行評審

摘要

The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).

原文	English
頁（從 - 到）	GP-12
期刊	Digests of the Intermag Conference
出版狀態	Published - 1999 十二月 1
事件	Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea 持續時間: 1999 五月 18 → 1999 五月 21

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

指紋深入研究「In-situ investigation of patterned magnetic domain structures using magnetic force microscope」主題。共同形成了獨特的指紋。

引用此

@article{d8aeeae8019a489e8aeea9a883164d28,

title = "In-situ investigation of patterned magnetic domain structures using magnetic force microscope",

abstract = "The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).",

author = "Wu, {J. C.} and Huang, {Y. W.} and Huang, {H. W.} and Wu, {Te ho}",

year = "1999",

month = dec,

day = "1",

language = "English",

pages = "GP--12",

journal = "Digests of the Intermag Conference",

issn = "0074-6843",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' ; Conference date: 18-05-1999 Through 21-05-1999",

}

TY - JOUR

T1 - In-situ investigation of patterned magnetic domain structures using magnetic force microscope

AU - Wu, J. C.

AU - Huang, Y. W.

AU - Huang, H. W.

AU - Wu, Te ho

PY - 1999/12/1

Y1 - 1999/12/1

N2 - The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).

AB - The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).

UR - http://www.scopus.com/inward/record.url?scp=0033299435&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033299435&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0033299435

SP - GP-12

JO - Digests of the Intermag Conference

JF - Digests of the Intermag Conference

SN - 0074-6843

T2 - Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99'

Y2 - 18 May 1999 through 21 May 1999

ER -