摘要
We present the high performance of InGaP/GaAs metal-semiconductor-metal photodetectors (MSM-PDs) using copper as the interdigital Schottky electrodes. The devices exhibit ultra-low dark current (70 pA at bias of 10 V) and ultra-fast pulse response (over 9 GHz). The notable dark current characteristic and the absence of trap-induced gain are accredited to the superior properties of InGaP capping layer. The superior performances of InGaP/GaAs MSM-PDs make it promising for data communication.
原文 | English |
---|---|
頁(從 - 到) | 724-731 |
頁數 | 8 |
期刊 | Proceedings of SPIE - The International Society for Optical Engineering |
卷 | 4078 |
出版狀態 | Published - 2000 一月 1 |
事件 | Optoelectronic Materials and Devices II - Taipei, Taiwan 持續時間: 2000 七月 26 → 2000 七月 28 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering