Effects of interface modification by H2O2 treatment on the electrical properties of n-type ZnO/p-type Si diodes

Guan Ru He, Yow Jon Lin, Hsing Cheng Chang, Ya Hui Chen

研究成果: Article › 同行評審

11 引文 斯高帕斯（Scopus）

指紋 深入研究「Effects of interface modification by H<sub>2</sub>O<sub>2</sub> treatment on the electrical properties of n-type ZnO/p-type Si diodes」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy