TY - JOUR
T1 - Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films
AU - Lin, Yow-Jon
AU - Wang, Mu Shan
AU - Liu, Chia-Jyi
AU - Huang, Hsueh Jung
PY - 2010/10/1
Y1 - 2010/10/1
N2 - The effect of changes in Li content on the structural property of sol-gel Li-doped ZnO films was investigated in this study. The observed changes of the Li incorporation-induced strain along c-axis are closely related to the different ratios between the concentrations of Li interstitials (Li i ) and Li substituting for Zn (Li Zn ) in the films. According to the observed results from X-ray diffraction (XRD) and photoluminescence measurements, we found that the domination of the dissociative mechanism in the Li-doped ZnO films led to transformation from Li Zn to Li i , involving the formation of Zn vacancies (V Zn ). In addition, the interaction between these defects (that is, Li Zn , Li i , V Zn and oxygen vacancy) and the crystal structure may lead to the abnormal shift of the (0 0 2) diffraction peak position determined from XRD measurements.
AB - The effect of changes in Li content on the structural property of sol-gel Li-doped ZnO films was investigated in this study. The observed changes of the Li incorporation-induced strain along c-axis are closely related to the different ratios between the concentrations of Li interstitials (Li i ) and Li substituting for Zn (Li Zn ) in the films. According to the observed results from X-ray diffraction (XRD) and photoluminescence measurements, we found that the domination of the dissociative mechanism in the Li-doped ZnO films led to transformation from Li Zn to Li i , involving the formation of Zn vacancies (V Zn ). In addition, the interaction between these defects (that is, Li Zn , Li i , V Zn and oxygen vacancy) and the crystal structure may lead to the abnormal shift of the (0 0 2) diffraction peak position determined from XRD measurements.
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U2 - 10.1016/j.apsusc.2010.06.016
DO - 10.1016/j.apsusc.2010.06.016
M3 - Article
AN - SCOPUS:77955417130
VL - 256
SP - 7623
EP - 7627
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
IS - 24
ER -