Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films

Yow-Jon Lin, Mu Shan Wang, Chia-Jyi Liu, Hsueh Jung Huang

研究成果: Article

38 引文 斯高帕斯(Scopus)

摘要

The effect of changes in Li content on the structural property of sol-gel Li-doped ZnO films was investigated in this study. The observed changes of the Li incorporation-induced strain along c-axis are closely related to the different ratios between the concentrations of Li interstitials (Li i ) and Li substituting for Zn (Li Zn ) in the films. According to the observed results from X-ray diffraction (XRD) and photoluminescence measurements, we found that the domination of the dissociative mechanism in the Li-doped ZnO films led to transformation from Li Zn to Li i , involving the formation of Zn vacancies (V Zn ). In addition, the interaction between these defects (that is, Li Zn , Li i , V Zn and oxygen vacancy) and the crystal structure may lead to the abnormal shift of the (0 0 2) diffraction peak position determined from XRD measurements.

原文English
頁(從 - 到)7623-7627
頁數5
期刊Applied Surface Science
256
發行號24
DOIs
出版狀態Published - 2010 十月 1

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

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