Contactless electroreflectance and piezoreflectance of a two-dimensional electron gas at a GaN/AlGaN heterointerface

D. Y. Lin, Y. S. Huang, Y. F. Chen, K. K. Tiong

研究成果: Article

16 引文 斯高帕斯(Scopus)

摘要

We have measured the contactless electroreflectance and piezoreflectance spectra at 300 and 20 K from a GaN/AlGaN heterojunction structure grown by metalorganic chemical vapor deposition on 6H-SiC substrate. The features related to a two-dimensional electron gas confined at the GaN/ AlGaN heterojunction are observed and the origin and nature of these features are discussed.

原文English
頁(從 - 到)533-536
頁數4
期刊Solid State Communications
107
發行號10
DOIs
出版狀態Published - 1998 七月 29

    指紋

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

引用此