Conduction behavior conversion for Cu-doped ZnS/n-type Si devices with different Cu contents

Wei Shih Ni, Yow Jon Lin

研究成果: Article同行評審

11 引文 斯高帕斯(Scopus)

指紋 深入研究「Conduction behavior conversion for Cu-doped ZnS/n-type Si devices with different Cu contents」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science