Comment on "influence of indium-tin-oxide thin-film quality on reverse leakage current of indium-tin-oxide/n-GaN Schottky contacts" [ Appl. Phys. Lett. 89, 033503 (2006)]

Yow Jon Lin, Chia Lung Tsai, Day Shan Liu

研究成果: Comment/debate同行評審

1 引文 斯高帕斯(Scopus)
原文English
文章編號046101
期刊Applied Physics Letters
90
發行號4
DOIs
出版狀態Published - 2007 二月 5

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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