Automatic measurement system for junction temperature of light emitting diodes

C. L. Kuo, Der-Yuh Lin

研究成果: Conference contribution

摘要

In this paper, we present a PC-based automatic measurement system for measuring the junction temperatures of light-emitting diodes (LEDs) operated at different forward currents. This system is described in three major parts: (1) screen panel and function design of control software (2) data acquisition and heating hardware (3) system integration and function test. In order to check and demonstrate its performance, the junction temperatures of three InGaN/GaN multiquantum well (MQW) LEDs have been performed by this system. The operating currents are reported in the range of 10-300 mA and the measured junction temperatures are obtained from 30 to 200 °C.

原文English
主出版物標題3CA 2010 - 2010 International Symposium on Computer, Communication, Control and Automation
頁面276-279
頁數4
1
DOIs
出版狀態Published - 2010 九月 3
事件2010 International Symposium on Computer, Communication, Control and Automation, 3CA 2010 - Tainan, Taiwan
持續時間: 2010 五月 52010 五月 7

Other

Other2010 International Symposium on Computer, Communication, Control and Automation, 3CA 2010
國家Taiwan
城市Tainan
期間10-05-0510-05-07

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Hardware and Architecture
  • Control and Systems Engineering

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  • 引用此

    Kuo, C. L., & Lin, D-Y. (2010). Automatic measurement system for junction temperature of light emitting diodes. 於 3CA 2010 - 2010 International Symposium on Computer, Communication, Control and Automation (卷 1, 頁 276-279). [5533832] https://doi.org/10.1109/3CA.2010.5533832