Analysis of tem image contrast of quantum-dot semiconductor clusters in glasses

Li Chi Liu, Subhash H. Risbud

研究成果: Article同行評審

10 引文 斯高帕斯(Scopus)

摘要

Nanometre-size semiconductor clusters trapped in glass matrices represent a novel class of nonlinear optical materials. Microstructural characterization of these materials by conventional and high-resolution transmission electron microscopy (TEM and HRTEM) shows the sensitivity of bright-field image contrast to the nature of the specific II-VI semiconductors (CdS, CdSe) precipitated in the glass matrices. An analysis based on electron-scattering intensity and structure-factor calculations is presented to account for the quality of TEM and HRTEM images observed for CdS- and CdSe-containing quantum-dot glasses.

原文English
頁(從 - 到)327-332
頁數6
期刊Philosophical Magazine Letters
61
發行號6
DOIs
出版狀態Published - 1990 六月

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

指紋 深入研究「Analysis of tem image contrast of quantum-dot semiconductor clusters in glasses」主題。共同形成了獨特的指紋。

引用此