Alternative method for measuring both the refractive indices and the thickness of silver-halide holographic plates

Cheng Chih Hsu, Jiun You Lin, Kun Huang Chen, Der Chin Su

研究成果: Article

1 引文 (Scopus)

摘要

First, the phase differences between s- and p-polarizations of a circularly polarized heterodyne light beam reflected from the emulsion layer, and that from its substrate, are measured, respectively. The measured data are substituted into specially derived equations, so the refractive indices of the emulsion layer and its substrate can be calculated. Second, the variations of phase differences between s- and p-polarizations due to the wavelength shifts and the extraction of the holographic plate in a modified Michelson interferometer are measured. Then, the thickness of the emulsion layer and its substrate can be estimated based on the measured values of refractive indices, the wavelength shifts, and the phase difference variations. This method has some advantages, such as high resolution and easy operation in only one optical configuration.

原文English
頁(從 - 到)1-6
頁數6
期刊Optical Engineering
44
發行號5
DOIs
出版狀態Published - 2005 五月 1

指紋

Silver halides
silver halides
emulsions
Emulsions
Refractive index
refractivity
sands
Substrates
Sand
Polarization
Michelson interferometers
Wavelength
shift
polarization
light beams
wavelengths
polarized light
high resolution
configurations

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

引用此文

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Alternative method for measuring both the refractive indices and the thickness of silver-halide holographic plates. / Hsu, Cheng Chih; Lin, Jiun You; Chen, Kun Huang; Su, Der Chin.

於: Optical Engineering, 卷 44, 編號 5, 01.05.2005, p. 1-6.

研究成果: Article

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AU - Lin, Jiun You

AU - Chen, Kun Huang

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