Three-dimensional random phase encoding in volume holograms and the applications

Ching Cherng Sun, Wei Chia Su, You Nian Lin, Shih Po Yeh, Bor Wang

Research output: Contribution to journalConference article

2 Citations (Scopus)

Abstract

Three-dimensional shifting sensitivity of volume holograms based on random phase encoding using a ground glass has been theoretically analyzed. There are different shifting tolerances in different shifting directions, which include laterally horizontal, laterally vertical, and longitudinal directions. The shifting sensitivity depends on the diameter of the illumination region on the random phase plate, the thickness of the hologram and the distance between them. We apply the theoretical calculation to a degeneracy condition, a point object, and theoretically analyze the shifting tolerance of shifting multiplexing in holographic storage and holographic confocal microscope.

Original languageEnglish
Pages (from-to)139-151
Number of pages13
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4110
DOIs
Publication statusPublished - 2000 Dec 1

Fingerprint

Hologram
Holograms
Tolerance
coding
Encoding
Three-dimensional
Confocal
sensitivity
Multiplexing
Degeneracy
multiplexing
Microscope
Illumination
Microscopes
Horizontal
Lighting
illumination
Vertical
microscopes
Glass

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

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Three-dimensional random phase encoding in volume holograms and the applications. / Sun, Ching Cherng; Su, Wei Chia; Lin, You Nian; Yeh, Shih Po; Wang, Bor.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 4110, 01.12.2000, p. 139-151.

Research output: Contribution to journalConference article

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