The construction of a real-time WIP exception monitoring system for semiconductor industry

Tsu Ming Yeh, Fan Yun Pai, Ching Shih Tsou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The agreement of due dates is the need for customer satisfaction, which is a critical factor to survive in today's highly competitive market for Semiconductor industry. However, undesirable and inevitable production variations make it difficult to maintain and improve factory's performance on due dates, especially for those back-end factories closer to customers. We, therefore, propose a WIP management model to help production managers effectively manage work-in-process (WIP) levels to compensate the impact of unexpected production variations and to achieve better due-date performance. This model includes the exception identification, detection, correction and root cause finding. A software package, Vigilance, is employed to construct real-time WIP exception management system. It is constructed to detect WIP exceptions, notify pertinent recipients and track exception resolution. Simulation experiments are conducted to evaluate the proposed exception management system. WIP correction action curtails the back-to-normal duration and prolongs the duration between two successive WIP exceptions. Therefore it provides better on time delivery and reduces the occurrences of WIP exceptions under proper Acceptable WIP deviation levels (AWDL) settings.

Original languageEnglish
Title of host publication2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008
DOIs
Publication statusPublished - 2008 Dec 31
Event2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008 - Dalian, China
Duration: 2008 Oct 122008 Oct 14

Publication series

Name2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008

Other

Other2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008
CountryChina
CityDalian
Period08-10-1208-10-14

Fingerprint

Process monitoring
Semiconductor materials
Industrial plants
Industry
Customer satisfaction
Software packages
Identification (control systems)
Managers
Experiments

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Software
  • Electrical and Electronic Engineering

Cite this

Yeh, T. M., Pai, F. Y., & Tsou, C. S. (2008). The construction of a real-time WIP exception monitoring system for semiconductor industry. In 2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008 [4681076] (2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008). https://doi.org/10.1109/WiCom.2008.2887
Yeh, Tsu Ming ; Pai, Fan Yun ; Tsou, Ching Shih. / The construction of a real-time WIP exception monitoring system for semiconductor industry. 2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008. 2008. (2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008).
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Yeh, TM, Pai, FY & Tsou, CS 2008, The construction of a real-time WIP exception monitoring system for semiconductor industry. in 2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008., 4681076, 2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008, 2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008, Dalian, China, 08-10-12. https://doi.org/10.1109/WiCom.2008.2887

The construction of a real-time WIP exception monitoring system for semiconductor industry. / Yeh, Tsu Ming; Pai, Fan Yun; Tsou, Ching Shih.

2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008. 2008. 4681076 (2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Yeh TM, Pai FY, Tsou CS. The construction of a real-time WIP exception monitoring system for semiconductor industry. In 2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008. 2008. 4681076. (2008 International Conference on Wireless Communications, Networking and Mobile Computing, WiCOM 2008). https://doi.org/10.1109/WiCom.2008.2887