We have measured the temperature dependence of the spectral features in the vicinity of the direct gap (Formula presented) of Si-containing carbon nitride polycrystalline films in the temperature range between 20 and 500 K using piezoreflectance (PzR). From a detailed line-shape fit to the PzR spectra, the (Formula presented) and the broadening parameter of direct band-to-band transitions at various temperatures are determined. The temperature dependence of (Formula presented) are analyzed by the Varshni equation [Physica 34, 149 (1967)] and an empirical expression proposed by O’Donnel and Chen [Appl. Phys. Lett. 58, 2924 (1991)]. The parameters that describe the temperature dependence of the energy gap of the material are evaluated and discussed. The broadening parameter is found to be insensitive to the temperature variation.
|Number of pages||4|
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|Publication status||Published - 1997 Jan 1|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics