Abstract
The effects of (NH4)2Sx treatment on the p-type GaN (p-GaN) were discussed using the photoluminescence and photoelectron spectroscopy measurements. It was found that the reduction of the surface state, related to the nitrogen-vacancy defects on the p-GaN surface, led to reduction in the surface band bending by 0.25 eV. The analysis showed that the intensity of the 2.8-eV photoluminescence band depended upon the amount of nitrogen vacancy of p-GaN.
Original language | English |
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Pages (from-to) | 5183-5185 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 81 |
Issue number | 27 |
DOIs | |
Publication status | Published - 2002 Dec 30 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)