Abstract
In this paper, we present an efficient diagnostic simulation method for combinational circuits. Two concepts are incorporated in this method. We adopt the critical line concept so that only stems, instead of all the faults, need to record the primary output responses and introduce the parallel simulation concept to propagate the effects of all the stems simultaneously. With these two approaches, our diagnostic simulator is efficient in speed and memory usage compared to an existed one.
| Original language | English |
|---|---|
| Pages (from-to) | 85-88 |
| Number of pages | 4 |
| Journal | Proceedings - IEEE International Symposium on Circuits and Systems |
| Volume | 1 |
| Publication status | Published - 1994 Dec 1 |
| Event | Proceedings of the 1994 IEEE International Symposium on Circuits and Systems. Part 3 (of 6) - London, England Duration: 1994 May 30 → 1994 Jun 2 |
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All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
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Super fast and memory efficient diagnostic simulation algorithm for combinational circuits. / Jou, Jer Min; Chen, Shung Chih; Chen, Ren Der.
In: Proceedings - IEEE International Symposium on Circuits and Systems, Vol. 1, 01.12.1994, p. 85-88.Research output: Contribution to journal › Conference article
TY - JOUR
T1 - Super fast and memory efficient diagnostic simulation algorithm for combinational circuits
AU - Jou, Jer Min
AU - Chen, Shung Chih
AU - Chen, Ren Der
PY - 1994/12/1
Y1 - 1994/12/1
N2 - In this paper, we present an efficient diagnostic simulation method for combinational circuits. Two concepts are incorporated in this method. We adopt the critical line concept so that only stems, instead of all the faults, need to record the primary output responses and introduce the parallel simulation concept to propagate the effects of all the stems simultaneously. With these two approaches, our diagnostic simulator is efficient in speed and memory usage compared to an existed one.
AB - In this paper, we present an efficient diagnostic simulation method for combinational circuits. Two concepts are incorporated in this method. We adopt the critical line concept so that only stems, instead of all the faults, need to record the primary output responses and introduce the parallel simulation concept to propagate the effects of all the stems simultaneously. With these two approaches, our diagnostic simulator is efficient in speed and memory usage compared to an existed one.
UR - http://www.scopus.com/inward/record.url?scp=0028602171&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0028602171&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0028602171
VL - 1
SP - 85
EP - 88
JO - Proceedings - IEEE International Symposium on Circuits and Systems
JF - Proceedings - IEEE International Symposium on Circuits and Systems
SN - 0271-4310
ER -