Super fast and memory efficient diagnostic simulation algorithm for combinational circuits

Jer Min Jou, Shung Chih Chen, Ren Der Chen

Research output: Contribution to journalConference article

Abstract

In this paper, we present an efficient diagnostic simulation method for combinational circuits. Two concepts are incorporated in this method. We adopt the critical line concept so that only stems, instead of all the faults, need to record the primary output responses and introduce the parallel simulation concept to propagate the effects of all the stems simultaneously. With these two approaches, our diagnostic simulator is efficient in speed and memory usage compared to an existed one.

Original languageEnglish
Pages (from-to)85-88
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
Volume1
Publication statusPublished - 1994 Dec 1
EventProceedings of the 1994 IEEE International Symposium on Circuits and Systems. Part 3 (of 6) - London, England
Duration: 1994 May 301994 Jun 2

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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