In this paper, we present an efficient diagnostic simulation method for combinational circuits. Two concepts are incorporated in this method. We adopt the critical line concept so that only stems, instead of all the faults, need to record the primary output responses and introduce the parallel simulation concept to propagate the effects of all the stems simultaneously. With these two approaches, our diagnostic simulator is efficient in speed and memory usage compared to an existed one.
|Number of pages||4|
|Journal||Proceedings - IEEE International Symposium on Circuits and Systems|
|Publication status||Published - 1994 Dec 1|
|Event||Proceedings of the 1994 IEEE International Symposium on Circuits and Systems. Part 3 (of 6) - London, England|
Duration: 1994 May 30 → 1994 Jun 2
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering