Super fast and memory efficient diagnostic simulation algorithm for combinational circuits

Jer Min Jou; Shung Chih Chen; Ren Der Chen

Super fast and memory efficient diagnostic simulation algorithm for combinational circuits

Jer Min Jou, Shung Chih Chen, Ren Der Chen

Department of Computer Science and Information Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

In this paper, we present an efficient diagnostic simulation method for combinational circuits. Two concepts are incorporated in this method. We adopt the critical line concept so that only stems, instead of all the faults, need to record the primary output responses and introduce the parallel simulation concept to propagate the effects of all the stems simultaneously. With these two approaches, our diagnostic simulator is efficient in speed and memory usage compared to an existed one.

Original language	English
Pages (from-to)	85-88
Number of pages	4
Journal	Proceedings - IEEE International Symposium on Circuits and Systems
Volume	1
Publication status	Published - 1994 Dec 1
Event	Proceedings of the 1994 IEEE International Symposium on Circuits and Systems. Part 3 (of 6) - London, England Duration: 1994 May 30 → 1994 Jun 2

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

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title = "Super fast and memory efficient diagnostic simulation algorithm for combinational circuits",

abstract = "In this paper, we present an efficient diagnostic simulation method for combinational circuits. Two concepts are incorporated in this method. We adopt the critical line concept so that only stems, instead of all the faults, need to record the primary output responses and introduce the parallel simulation concept to propagate the effects of all the stems simultaneously. With these two approaches, our diagnostic simulator is efficient in speed and memory usage compared to an existed one.",

author = "Jou, {Jer Min} and Chen, {Shung Chih} and Chen, {Ren Der}",

year = "1994",

month = dec,

day = "1",

language = "English",

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journal = "Proceedings - IEEE International Symposium on Circuits and Systems",

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publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the 1994 IEEE International Symposium on Circuits and Systems. Part 3 (of 6) ; Conference date: 30-05-1994 Through 02-06-1994",

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AU - Chen, Shung Chih

AU - Chen, Ren Der

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N2 - In this paper, we present an efficient diagnostic simulation method for combinational circuits. Two concepts are incorporated in this method. We adopt the critical line concept so that only stems, instead of all the faults, need to record the primary output responses and introduce the parallel simulation concept to propagate the effects of all the stems simultaneously. With these two approaches, our diagnostic simulator is efficient in speed and memory usage compared to an existed one.

AB - In this paper, we present an efficient diagnostic simulation method for combinational circuits. Two concepts are incorporated in this method. We adopt the critical line concept so that only stems, instead of all the faults, need to record the primary output responses and introduce the parallel simulation concept to propagate the effects of all the stems simultaneously. With these two approaches, our diagnostic simulator is efficient in speed and memory usage compared to an existed one.

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M3 - Conference article

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VL - 1

SP - 85

EP - 88

JO - Proceedings - IEEE International Symposium on Circuits and Systems

JF - Proceedings - IEEE International Symposium on Circuits and Systems

SN - 0271-4310

T2 - Proceedings of the 1994 IEEE International Symposium on Circuits and Systems. Part 3 (of 6)

Y2 - 30 May 1994 through 2 June 1994

ER -