Study of image sticking of LC cell with dielectric spectrum

Yi Lin Tsai, Ying Guey Fuhv, Chun Ying Huang, Ching Yu Chen, Chi-Yen Huang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigate dielectric spectrum (DS) of the LC ceils. The DS of the cell shift to the low frequency region during DC voltage stress (DCVS), and restores to the on'ginal position after DCVS. The cell with image sticking restore slower than that of the cell without image sticking.

Original languageEnglish
Title of host publication23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016
PublisherSociety for Information Display
Pages670-672
Number of pages3
ISBN (Electronic)9781510845510
Publication statusPublished - 2016 Jan 1
Event23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016 - Fukuoka, Japan
Duration: 2016 Dec 72016 Dec 9

Publication series

Name23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016
Volume2

Other

Other23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016
CountryJapan
CityFukuoka
Period16-12-0716-12-09

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Human-Computer Interaction
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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