Structural, electrical, optical and magnetic properties of Co 0.2 Al x Zn 0.8-x O films

Chia Lung Tsai, Yow-Jon Lin, Chia-Jyi Liu, Lance Horng, Yu-Tai Shih, Mu Shan Wang, Chao Shien Huang, Chuan Sheng Jhang, Ya Hui Chen, Hsing Cheng Chang

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

Co 0.2 Al x Zn 0.8-x O films prepared with different molar ratio of aluminum nitrate to zinc acetate were deposited on substrates by the sol-gel technique. X-ray diffraction, photoluminescence and ferromagnetism measurements were used to characterize the Co 0.2 Al x Zn 0.8-x O diluted magnetic semiconductors. The authors found that the intensity of the acceptor-related photoluminescence increased with increasing aluminum concentration and an increase in the number of the acceptor-like defects (zinc vacancies especially) in the Co 0.2 Al x Zn 0.8-x O film might lead to the enhancement of the magnetic properties. This implies that controls of the aluminum concentration and the number of the acceptor-like defects are important factors to produce strong ferromagnetism Co 0.2 Al x Zn 0.8-x O films prepared by the sol-gel method.

Original languageEnglish
Pages (from-to)8643-8647
Number of pages5
JournalApplied Surface Science
Volume255
Issue number20
DOIs
Publication statusPublished - 2009 Jul 30

Fingerprint

Structural properties
Magnetic properties
Electric properties
Optical properties
Ferromagnetism
Aluminum
Photoluminescence
Zinc
Zinc Acetate
Defects
Sol-gel process
Vacancies
Sol-gels
Nitrates
X ray diffraction
Substrates
Diluted magnetic semiconductors
aluminum nitrate

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

Tsai, Chia Lung ; Lin, Yow-Jon ; Liu, Chia-Jyi ; Horng, Lance ; Shih, Yu-Tai ; Wang, Mu Shan ; Huang, Chao Shien ; Jhang, Chuan Sheng ; Chen, Ya Hui ; Chang, Hsing Cheng. / Structural, electrical, optical and magnetic properties of Co 0.2 Al x Zn 0.8-x O films In: Applied Surface Science. 2009 ; Vol. 255, No. 20. pp. 8643-8647.
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Structural, electrical, optical and magnetic properties of Co 0.2 Al x Zn 0.8-x O films . / Tsai, Chia Lung; Lin, Yow-Jon; Liu, Chia-Jyi; Horng, Lance; Shih, Yu-Tai; Wang, Mu Shan; Huang, Chao Shien; Jhang, Chuan Sheng; Chen, Ya Hui; Chang, Hsing Cheng.

In: Applied Surface Science, Vol. 255, No. 20, 30.07.2009, p. 8643-8647.

Research output: Contribution to journalArticle

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AU - Tsai, Chia Lung

AU - Lin, Yow-Jon

AU - Liu, Chia-Jyi

AU - Horng, Lance

AU - Shih, Yu-Tai

AU - Wang, Mu Shan

AU - Huang, Chao Shien

AU - Jhang, Chuan Sheng

AU - Chen, Ya Hui

AU - Chang, Hsing Cheng

PY - 2009/7/30

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N2 - Co 0.2 Al x Zn 0.8-x O films prepared with different molar ratio of aluminum nitrate to zinc acetate were deposited on substrates by the sol-gel technique. X-ray diffraction, photoluminescence and ferromagnetism measurements were used to characterize the Co 0.2 Al x Zn 0.8-x O diluted magnetic semiconductors. The authors found that the intensity of the acceptor-related photoluminescence increased with increasing aluminum concentration and an increase in the number of the acceptor-like defects (zinc vacancies especially) in the Co 0.2 Al x Zn 0.8-x O film might lead to the enhancement of the magnetic properties. This implies that controls of the aluminum concentration and the number of the acceptor-like defects are important factors to produce strong ferromagnetism Co 0.2 Al x Zn 0.8-x O films prepared by the sol-gel method.

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