Abstract
Co 0.2 Al x Zn 0.8-x O films prepared with different molar ratio of aluminum nitrate to zinc acetate were deposited on substrates by the sol-gel technique. X-ray diffraction, photoluminescence and ferromagnetism measurements were used to characterize the Co 0.2 Al x Zn 0.8-x O diluted magnetic semiconductors. The authors found that the intensity of the acceptor-related photoluminescence increased with increasing aluminum concentration and an increase in the number of the acceptor-like defects (zinc vacancies especially) in the Co 0.2 Al x Zn 0.8-x O film might lead to the enhancement of the magnetic properties. This implies that controls of the aluminum concentration and the number of the acceptor-like defects are important factors to produce strong ferromagnetism Co 0.2 Al x Zn 0.8-x O films prepared by the sol-gel method.
| Original language | English |
|---|---|
| Pages (from-to) | 8643-8647 |
| Number of pages | 5 |
| Journal | Applied Surface Science |
| Volume | 255 |
| Issue number | 20 |
| DOIs | |
| Publication status | Published - 2009 Jul 30 |
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All Science Journal Classification (ASJC) codes
- Chemistry(all)
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films
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Structural, electrical, optical and magnetic properties of Co 0.2 Al x Zn 0.8-x O films . / Tsai, Chia Lung; Lin, Yow-Jon; Liu, Chia-Jyi; Horng, Lance; Shih, Yu-Tai; Wang, Mu Shan; Huang, Chao Shien; Jhang, Chuan Sheng; Chen, Ya Hui; Chang, Hsing Cheng.
In: Applied Surface Science, Vol. 255, No. 20, 30.07.2009, p. 8643-8647.Research output: Contribution to journal › Article
TY - JOUR
T1 - Structural, electrical, optical and magnetic properties of Co 0.2 Al x Zn 0.8-x O films
AU - Tsai, Chia Lung
AU - Lin, Yow-Jon
AU - Liu, Chia-Jyi
AU - Horng, Lance
AU - Shih, Yu-Tai
AU - Wang, Mu Shan
AU - Huang, Chao Shien
AU - Jhang, Chuan Sheng
AU - Chen, Ya Hui
AU - Chang, Hsing Cheng
PY - 2009/7/30
Y1 - 2009/7/30
N2 - Co 0.2 Al x Zn 0.8-x O films prepared with different molar ratio of aluminum nitrate to zinc acetate were deposited on substrates by the sol-gel technique. X-ray diffraction, photoluminescence and ferromagnetism measurements were used to characterize the Co 0.2 Al x Zn 0.8-x O diluted magnetic semiconductors. The authors found that the intensity of the acceptor-related photoluminescence increased with increasing aluminum concentration and an increase in the number of the acceptor-like defects (zinc vacancies especially) in the Co 0.2 Al x Zn 0.8-x O film might lead to the enhancement of the magnetic properties. This implies that controls of the aluminum concentration and the number of the acceptor-like defects are important factors to produce strong ferromagnetism Co 0.2 Al x Zn 0.8-x O films prepared by the sol-gel method.
AB - Co 0.2 Al x Zn 0.8-x O films prepared with different molar ratio of aluminum nitrate to zinc acetate were deposited on substrates by the sol-gel technique. X-ray diffraction, photoluminescence and ferromagnetism measurements were used to characterize the Co 0.2 Al x Zn 0.8-x O diluted magnetic semiconductors. The authors found that the intensity of the acceptor-related photoluminescence increased with increasing aluminum concentration and an increase in the number of the acceptor-like defects (zinc vacancies especially) in the Co 0.2 Al x Zn 0.8-x O film might lead to the enhancement of the magnetic properties. This implies that controls of the aluminum concentration and the number of the acceptor-like defects are important factors to produce strong ferromagnetism Co 0.2 Al x Zn 0.8-x O films prepared by the sol-gel method.
UR - http://www.scopus.com/inward/record.url?scp=67650503637&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=67650503637&partnerID=8YFLogxK
U2 - 10.1016/j.apsusc.2009.06.040
DO - 10.1016/j.apsusc.2009.06.040
M3 - Article
AN - SCOPUS:67650503637
VL - 255
SP - 8643
EP - 8647
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
IS - 20
ER -