Structural, electrical, optical and magnetic properties of Co 0.2 Al x Zn 0.8-x O films

Chia Lung Tsai, Yow-Jon Lin, Chia-Jyi Liu, Lance Horng, Yu-Tai Shih, Mu Shan Wang, Chao Shien Huang, Chuan Sheng Jhang, Ya Hui Chen, Hsing Cheng Chang

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Abstract

Co 0.2 Al x Zn 0.8-x O films prepared with different molar ratio of aluminum nitrate to zinc acetate were deposited on substrates by the sol-gel technique. X-ray diffraction, photoluminescence and ferromagnetism measurements were used to characterize the Co 0.2 Al x Zn 0.8-x O diluted magnetic semiconductors. The authors found that the intensity of the acceptor-related photoluminescence increased with increasing aluminum concentration and an increase in the number of the acceptor-like defects (zinc vacancies especially) in the Co 0.2 Al x Zn 0.8-x O film might lead to the enhancement of the magnetic properties. This implies that controls of the aluminum concentration and the number of the acceptor-like defects are important factors to produce strong ferromagnetism Co 0.2 Al x Zn 0.8-x O films prepared by the sol-gel method.

Original languageEnglish
Pages (from-to)8643-8647
Number of pages5
JournalApplied Surface Science
Volume255
Issue number20
DOIs
Publication statusPublished - 2009 Jul 30

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All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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