Abstract
Co 0.2 Al x Zn 0.8-x O films prepared with different molar ratio of aluminum nitrate to zinc acetate were deposited on substrates by the sol-gel technique. X-ray diffraction, photoluminescence and ferromagnetism measurements were used to characterize the Co 0.2 Al x Zn 0.8-x O diluted magnetic semiconductors. The authors found that the intensity of the acceptor-related photoluminescence increased with increasing aluminum concentration and an increase in the number of the acceptor-like defects (zinc vacancies especially) in the Co 0.2 Al x Zn 0.8-x O film might lead to the enhancement of the magnetic properties. This implies that controls of the aluminum concentration and the number of the acceptor-like defects are important factors to produce strong ferromagnetism Co 0.2 Al x Zn 0.8-x O films prepared by the sol-gel method.
Original language | English |
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Pages (from-to) | 8643-8647 |
Number of pages | 5 |
Journal | Applied Surface Science |
Volume | 255 |
Issue number | 20 |
DOIs | |
Publication status | Published - 2009 Jul 30 |
All Science Journal Classification (ASJC) codes
- Chemistry(all)
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films