Soft X-Ray Photoemission Electron Microscopy Station with Polarized Radiation

D. H. Wei, Y. J. Hsu, G. C. Yin, Y. S. Wu, S. C. Chuang, K. L. Tsang, J. Y. Ou, J. C. Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have established a soft x-ray photoemission electron microscopy station at BL05B elliptically polarized undulator beamline, which provides an average photon flux of 1× 1012 photons/sec in energies from 60 to 1400 eV with an resolving power of greater than 100000. Combination of the variable polarization and high brightness photon source makes the microscopy station powerful enough to spatially resolve the absorption anisotropy in micrometer sized area. We present some of the commission results to show the element-specific magnetic domain images and contrast enhancement by the polarized photon source.

Original languageEnglish
Title of host publicationSynchrotron Radiation Instrumentation
Subtitle of host publication8th International Conference on Synchrotron Radiation Instrumentation
PublisherAmerican Institute of Physics Inc.
Pages905-908
Number of pages4
ISBN (Electronic)0735401799
DOIs
Publication statusPublished - 2004 May 12
Event8th International Conference on Synchrotron Radiation Instrumentation - San Francisco, United States
Duration: 2003 Aug 252003 Aug 29

Publication series

NameAIP Conference Proceedings
Volume705
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other8th International Conference on Synchrotron Radiation Instrumentation
CountryUnited States
CitySan Francisco
Period03-08-2503-08-29

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Wei, D. H., Hsu, Y. J., Yin, G. C., Wu, Y. S., Chuang, S. C., Tsang, K. L., Ou, J. Y., & Wu, J. C. (2004). Soft X-Ray Photoemission Electron Microscopy Station with Polarized Radiation. In Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation (pp. 905-908). (AIP Conference Proceedings; Vol. 705). American Institute of Physics Inc.. https://doi.org/10.1063/1.1757942