Soft X-Ray Photoemission Electron Microscopy Station with Polarized Radiation

D. H. Wei, Y. J. Hsu, G. C. Yin, Y. S. Wu, S. C. Chuang, K. L. Tsang, J. Y. Ou, J. C. Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have established a soft x-ray photoemission electron microscopy station at BL05B elliptically polarized undulator beamline, which provides an average photon flux of 1× 1012 photons/sec in energies from 60 to 1400 eV with an resolving power of greater than 100000. Combination of the variable polarization and high brightness photon source makes the microscopy station powerful enough to spatially resolve the absorption anisotropy in micrometer sized area. We present some of the commission results to show the element-specific magnetic domain images and contrast enhancement by the polarized photon source.

Original languageEnglish
Title of host publicationSynchrotron Radiation Instrumentation
Subtitle of host publication8th International Conference on Synchrotron Radiation Instrumentation
PublisherAmerican Institute of Physics Inc.
Pages905-908
Number of pages4
ISBN (Electronic)0735401799
DOIs
Publication statusPublished - 2004 May 12
Event8th International Conference on Synchrotron Radiation Instrumentation - San Francisco, United States
Duration: 2003 Aug 252003 Aug 29

Publication series

NameAIP Conference Proceedings
Volume705
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other8th International Conference on Synchrotron Radiation Instrumentation
CountryUnited States
CitySan Francisco
Period03-08-2503-08-29

Fingerprint

polarized radiation
electron microscopy
photoelectric emission
stations
photons
x rays
magnetic domains
micrometers
brightness
microscopy
anisotropy
augmentation
polarization
energy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Wei, D. H., Hsu, Y. J., Yin, G. C., Wu, Y. S., Chuang, S. C., Tsang, K. L., ... Wu, J. C. (2004). Soft X-Ray Photoemission Electron Microscopy Station with Polarized Radiation. In Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation (pp. 905-908). (AIP Conference Proceedings; Vol. 705). American Institute of Physics Inc.. https://doi.org/10.1063/1.1757942
Wei, D. H. ; Hsu, Y. J. ; Yin, G. C. ; Wu, Y. S. ; Chuang, S. C. ; Tsang, K. L. ; Ou, J. Y. ; Wu, J. C. / Soft X-Ray Photoemission Electron Microscopy Station with Polarized Radiation. Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation. American Institute of Physics Inc., 2004. pp. 905-908 (AIP Conference Proceedings).
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abstract = "We have established a soft x-ray photoemission electron microscopy station at BL05B elliptically polarized undulator beamline, which provides an average photon flux of 1× 1012 photons/sec in energies from 60 to 1400 eV with an resolving power of greater than 100000. Combination of the variable polarization and high brightness photon source makes the microscopy station powerful enough to spatially resolve the absorption anisotropy in micrometer sized area. We present some of the commission results to show the element-specific magnetic domain images and contrast enhancement by the polarized photon source.",
author = "Wei, {D. H.} and Hsu, {Y. J.} and Yin, {G. C.} and Wu, {Y. S.} and Chuang, {S. C.} and Tsang, {K. L.} and Ou, {J. Y.} and Wu, {J. C.}",
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Wei, DH, Hsu, YJ, Yin, GC, Wu, YS, Chuang, SC, Tsang, KL, Ou, JY & Wu, JC 2004, Soft X-Ray Photoemission Electron Microscopy Station with Polarized Radiation. in Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation. AIP Conference Proceedings, vol. 705, American Institute of Physics Inc., pp. 905-908, 8th International Conference on Synchrotron Radiation Instrumentation, San Francisco, United States, 03-08-25. https://doi.org/10.1063/1.1757942

Soft X-Ray Photoemission Electron Microscopy Station with Polarized Radiation. / Wei, D. H.; Hsu, Y. J.; Yin, G. C.; Wu, Y. S.; Chuang, S. C.; Tsang, K. L.; Ou, J. Y.; Wu, J. C.

Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation. American Institute of Physics Inc., 2004. p. 905-908 (AIP Conference Proceedings; Vol. 705).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AB - We have established a soft x-ray photoemission electron microscopy station at BL05B elliptically polarized undulator beamline, which provides an average photon flux of 1× 1012 photons/sec in energies from 60 to 1400 eV with an resolving power of greater than 100000. Combination of the variable polarization and high brightness photon source makes the microscopy station powerful enough to spatially resolve the absorption anisotropy in micrometer sized area. We present some of the commission results to show the element-specific magnetic domain images and contrast enhancement by the polarized photon source.

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Wei DH, Hsu YJ, Yin GC, Wu YS, Chuang SC, Tsang KL et al. Soft X-Ray Photoemission Electron Microscopy Station with Polarized Radiation. In Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation. American Institute of Physics Inc. 2004. p. 905-908. (AIP Conference Proceedings). https://doi.org/10.1063/1.1757942