Small displacement measurements based on total-internal-reflection heterodyne interferometry

Ming Horng Chiu, Jiun-You Lin, Der Chin Su

Research output: Contribution to journalConference article

2 Citations (Scopus)

Abstract

A novel method for measuring small displacements based on the total-internal-reflection-heterodyne interferometry is presented. In this method, a common-path heterodyne interferometer is applied to measure the phase differences between s and p polarizations at total-internal reflection. The phase differences depend on the incident angles which are the function of displacements by using the image formula. Hence, small displacements can be evaluated only by measuring the phase differences. In our optical setup, a heterodyne light source with a frequency difference 800 Hz between s and p polarizations is used. A light beam passing through a lens is reflected from a mirror located near the focal plane of the objective lens and is driven by a piezo-electric transducer. If the mirror shifts from the focal plane of the lens, the reflected beam deflects with a small angular deviation to a phase difference measurement system. From Fresnel's equations, the phase difference between s and p polarizations is the function of incident angle and the numbers of TIR at total-internal reflection condition. To compare this test signal with a reference signal using a phase meter, the phase difference can be measured in real-time. Consequently, the displacement also can be calculated.

Original languageEnglish
Pages (from-to)32-38
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3835
Publication statusPublished - 1999 Dec 1
EventProceedings of the 1999 Three-Dimensional Imaging, Optical Metrology, and Inspection V - Boston, MA, USA
Duration: 1999 Sep 191999 Sep 20

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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