Simple method for measuring small wavelength differences

Jiun-You Lin, Kun Huang Chen, Jing Heng Chen

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A simple method is presented to determine small wavelength differences based on the dispersion properties of a uniaxial crystal and circularly polarized heterodyne interferometry. A circularly polarized heterodyne light beam is incident on a uniaxial crystal at the Brewster's angle, and the reflected light beam passes through an analyzer for interference. Owing to proper azimuth angles of the transmission axis of the analyzer and the optical axis of the crystal, the variation of the phase difference determined with the heterodyne interferometric technique of the interference signal is significantly enhanced, resulting in an accurate wavelength variation. The feasibility of this method was demonstrated, and the sensitivity of wavelength differences is about 0.001 nm. The proposed approach has a simple structure, straightforward operation, high stability, and high sensitivity.

Original languageEnglish
Article number113605
JournalOptical Engineering
Volume46
Issue number11
DOIs
Publication statusPublished - 2007 Dec 10

Fingerprint

light beams
Wavelength
analyzers
wavelengths
Crystals
crystals
interference
Brewster angle
sensitivity
Wave interference
azimuth
polarized light
interferometry
Signal interference
Interferometry

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

Cite this

Lin, Jiun-You ; Chen, Kun Huang ; Chen, Jing Heng. / Simple method for measuring small wavelength differences. In: Optical Engineering. 2007 ; Vol. 46, No. 11.
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Simple method for measuring small wavelength differences. / Lin, Jiun-You; Chen, Kun Huang; Chen, Jing Heng.

In: Optical Engineering, Vol. 46, No. 11, 113605, 10.12.2007.

Research output: Contribution to journalArticle

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