Abstract
We present a systematic investigation of the current/voltage lead effect on magnetization reversal of microstructured permalloy rings. The magnetic rings with film thickness of 23 nm and outer/inner diameter of 5/3 μm, respectively, were patched by nonmagnetic gold leads designed with various angles, 10°, 20°, and 30°. Longitudinal magnetoresistance measurement was adopted to demonstrate the short-circuiting effect. The mechanism can be attributed to the formation of the vortex structures developed beneath the lead-covered areas, in which the vortex pair domain configuration was confirmed using a magnetic force microscopy.
| Original language | English |
|---|---|
| Pages (from-to) | 1986-1988 |
| Number of pages | 3 |
| Journal | Journal of Magnetism and Magnetic Materials |
| Volume | 310 |
| Issue number | 2 SUPPL. PART 3 |
| DOIs | |
| Publication status | Published - 2007 Mar 1 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
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Short-circuiting effect on the magnetoresistance of microstructured permalloy rings. / Chao, C. T.; Lin, Lin; Wu, Jong-Ching; Wei, Zung Hang; Lai, Mei Feng; Chang, Ching Ray.
In: Journal of Magnetism and Magnetic Materials, Vol. 310, No. 2 SUPPL. PART 3, 01.03.2007, p. 1986-1988.Research output: Contribution to journal › Article
TY - JOUR
T1 - Short-circuiting effect on the magnetoresistance of microstructured permalloy rings
AU - Chao, C. T.
AU - Lin, Lin
AU - Wu, Jong-Ching
AU - Wei, Zung Hang
AU - Lai, Mei Feng
AU - Chang, Ching Ray
PY - 2007/3/1
Y1 - 2007/3/1
N2 - We present a systematic investigation of the current/voltage lead effect on magnetization reversal of microstructured permalloy rings. The magnetic rings with film thickness of 23 nm and outer/inner diameter of 5/3 μm, respectively, were patched by nonmagnetic gold leads designed with various angles, 10°, 20°, and 30°. Longitudinal magnetoresistance measurement was adopted to demonstrate the short-circuiting effect. The mechanism can be attributed to the formation of the vortex structures developed beneath the lead-covered areas, in which the vortex pair domain configuration was confirmed using a magnetic force microscopy.
AB - We present a systematic investigation of the current/voltage lead effect on magnetization reversal of microstructured permalloy rings. The magnetic rings with film thickness of 23 nm and outer/inner diameter of 5/3 μm, respectively, were patched by nonmagnetic gold leads designed with various angles, 10°, 20°, and 30°. Longitudinal magnetoresistance measurement was adopted to demonstrate the short-circuiting effect. The mechanism can be attributed to the formation of the vortex structures developed beneath the lead-covered areas, in which the vortex pair domain configuration was confirmed using a magnetic force microscopy.
UR - http://www.scopus.com/inward/record.url?scp=33847626657&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33847626657&partnerID=8YFLogxK
U2 - 10.1016/j.jmmm.2006.11.026
DO - 10.1016/j.jmmm.2006.11.026
M3 - Article
AN - SCOPUS:33847626657
VL - 310
SP - 1986
EP - 1988
JO - Journal of Magnetism and Magnetic Materials
JF - Journal of Magnetism and Magnetic Materials
SN - 0304-8853
IS - 2 SUPPL. PART 3
ER -