Short-circuiting effect on the magnetoresistance of microstructured permalloy rings

C. T. Chao; L. K. Lin; J. C. Wu; Zung Hang Wei; Mei Feng Lai; Ching Ray Chang

doi:10.1016/j.jmmm.2006.11.026

Short-circuiting effect on the magnetoresistance of microstructured permalloy rings

C. T. Chao, L. K. Lin, J. C. Wu, Zung Hang Wei, Mei Feng Lai, Ching Ray Chang

Department of Physics

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

We present a systematic investigation of the current/voltage lead effect on magnetization reversal of microstructured permalloy rings. The magnetic rings with film thickness of 23 nm and outer/inner diameter of 5/3 μm, respectively, were patched by nonmagnetic gold leads designed with various angles, 10°, 20°, and 30°. Longitudinal magnetoresistance measurement was adopted to demonstrate the short-circuiting effect. The mechanism can be attributed to the formation of the vortex structures developed beneath the lead-covered areas, in which the vortex pair domain configuration was confirmed using a magnetic force microscopy.

Original language	English
Pages (from-to)	1986-1988
Number of pages	3
Journal	Journal of Magnetism and Magnetic Materials
Volume	310
Issue number	2 SUPPL. PART 3
DOIs	https://doi.org/10.1016/j.jmmm.2006.11.026
Publication status	Published - 2007 Mar 1

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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title = "Short-circuiting effect on the magnetoresistance of microstructured permalloy rings",

abstract = "We present a systematic investigation of the current/voltage lead effect on magnetization reversal of microstructured permalloy rings. The magnetic rings with film thickness of 23 nm and outer/inner diameter of 5/3 μm, respectively, were patched by nonmagnetic gold leads designed with various angles, 10°, 20°, and 30°. Longitudinal magnetoresistance measurement was adopted to demonstrate the short-circuiting effect. The mechanism can be attributed to the formation of the vortex structures developed beneath the lead-covered areas, in which the vortex pair domain configuration was confirmed using a magnetic force microscopy.",

author = "Chao, {C. T.} and Lin, {L. K.} and Wu, {J. C.} and Wei, {Zung Hang} and Lai, {Mei Feng} and Chang, {Ching Ray}",

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T1 - Short-circuiting effect on the magnetoresistance of microstructured permalloy rings

AU - Chao, C. T.

AU - Lin, L. K.

AU - Wu, J. C.

AU - Wei, Zung Hang

AU - Lai, Mei Feng

AU - Chang, Ching Ray

PY - 2007/3/1

Y1 - 2007/3/1

N2 - We present a systematic investigation of the current/voltage lead effect on magnetization reversal of microstructured permalloy rings. The magnetic rings with film thickness of 23 nm and outer/inner diameter of 5/3 μm, respectively, were patched by nonmagnetic gold leads designed with various angles, 10°, 20°, and 30°. Longitudinal magnetoresistance measurement was adopted to demonstrate the short-circuiting effect. The mechanism can be attributed to the formation of the vortex structures developed beneath the lead-covered areas, in which the vortex pair domain configuration was confirmed using a magnetic force microscopy.

AB - We present a systematic investigation of the current/voltage lead effect on magnetization reversal of microstructured permalloy rings. The magnetic rings with film thickness of 23 nm and outer/inner diameter of 5/3 μm, respectively, were patched by nonmagnetic gold leads designed with various angles, 10°, 20°, and 30°. Longitudinal magnetoresistance measurement was adopted to demonstrate the short-circuiting effect. The mechanism can be attributed to the formation of the vortex structures developed beneath the lead-covered areas, in which the vortex pair domain configuration was confirmed using a magnetic force microscopy.

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SP - 1986

EP - 1988

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

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