Abstract
Using a mode-locking Nd:YAG laser, we measured the second harmonic generation (SHG) of polymer stabilized cholesteric texture (PSCT) films. SHG observed in these samples is due to the dielectric gradient which arises from the interfaces between the cholesteric liquid crystal/polymer and those between the adjacent cholesteric focal conic domains having different helical axis. Both of the SHG intensities and the electro-optical characteristics of PSCTs were measured as a function of polymer concentration. In addition, polymer network structures formed in PSCTs were investigated. Good correlations among the SHG measurements, electro-optical characteristics, and the polymer network morphologies were found. It means that SHG measurements could provide us another qualitative, nondestructive method to analyze the PSCT films. In addition, SHG change on polymerization can be used to monitor the polymerization of LC-polymer mixtures.
| Original language | English |
|---|---|
| Pages (from-to) | 66-75 |
| Number of pages | 10 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3475 |
| DOIs | |
| Publication status | Published - 1998 Dec 1 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
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Second harmonic generation studies of polymer-stabilized cholesteric texture films. / Fuh, Andy Ying Guey; Huang, Chi Yen; Lau, Cheuk Wah.
In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 3475, 01.12.1998, p. 66-75.Research output: Contribution to journal › Conference article
TY - JOUR
T1 - Second harmonic generation studies of polymer-stabilized cholesteric texture films
AU - Fuh, Andy Ying Guey
AU - Huang, Chi Yen
AU - Lau, Cheuk Wah
PY - 1998/12/1
Y1 - 1998/12/1
N2 - Using a mode-locking Nd:YAG laser, we measured the second harmonic generation (SHG) of polymer stabilized cholesteric texture (PSCT) films. SHG observed in these samples is due to the dielectric gradient which arises from the interfaces between the cholesteric liquid crystal/polymer and those between the adjacent cholesteric focal conic domains having different helical axis. Both of the SHG intensities and the electro-optical characteristics of PSCTs were measured as a function of polymer concentration. In addition, polymer network structures formed in PSCTs were investigated. Good correlations among the SHG measurements, electro-optical characteristics, and the polymer network morphologies were found. It means that SHG measurements could provide us another qualitative, nondestructive method to analyze the PSCT films. In addition, SHG change on polymerization can be used to monitor the polymerization of LC-polymer mixtures.
AB - Using a mode-locking Nd:YAG laser, we measured the second harmonic generation (SHG) of polymer stabilized cholesteric texture (PSCT) films. SHG observed in these samples is due to the dielectric gradient which arises from the interfaces between the cholesteric liquid crystal/polymer and those between the adjacent cholesteric focal conic domains having different helical axis. Both of the SHG intensities and the electro-optical characteristics of PSCTs were measured as a function of polymer concentration. In addition, polymer network structures formed in PSCTs were investigated. Good correlations among the SHG measurements, electro-optical characteristics, and the polymer network morphologies were found. It means that SHG measurements could provide us another qualitative, nondestructive method to analyze the PSCT films. In addition, SHG change on polymerization can be used to monitor the polymerization of LC-polymer mixtures.
UR - http://www.scopus.com/inward/record.url?scp=0038414796&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0038414796&partnerID=8YFLogxK
U2 - 10.1117/12.326892
DO - 10.1117/12.326892
M3 - Conference article
VL - 3475
SP - 66
EP - 75
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
SN - 0277-786X
ER -