Abstract
The scattering characteristics of the latest type of strip gratings with layered periodical dielectrical substrate for TE case was analyzed using the mode matching technique. The effects of the strip width and thickness on the scattering characteristics of the periodical structure were calculated and analyzed. The boundary conditions of electric and magnetic fields at each interface could be enforced to obtain recursive relations needed for computing the fields. The larger reflected power was obtained for the structure with thicker strips.
| Original language | English |
|---|---|
| Pages (from-to) | 398-401 |
| Number of pages | 4 |
| Journal | IEEE Antennas and Propagation Society, AP-S International Symposium (Digest) |
| Volume | 4 |
| Publication status | Published - 2001 Nov 26 |
| Event | 2001 IEEE Antennas and Propagation Society International Symposium-Adaptive Arrays in Communications- - Boston, MA, United States Duration: 2001 Jul 8 → 2001 Jul 13 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
Cite this
}
Scattering analysis of strip gratings with layered periodical substrate for TE case. / Lee, C. H.; Hsu, C. I.G.; Kiang, J. F.; Lee, C. C.
In: IEEE Antennas and Propagation Society, AP-S International Symposium (Digest), Vol. 4, 26.11.2001, p. 398-401.Research output: Contribution to journal › Conference article
TY - JOUR
T1 - Scattering analysis of strip gratings with layered periodical substrate for TE case
AU - Lee, C. H.
AU - Hsu, C. I.G.
AU - Kiang, J. F.
AU - Lee, C. C.
PY - 2001/11/26
Y1 - 2001/11/26
N2 - The scattering characteristics of the latest type of strip gratings with layered periodical dielectrical substrate for TE case was analyzed using the mode matching technique. The effects of the strip width and thickness on the scattering characteristics of the periodical structure were calculated and analyzed. The boundary conditions of electric and magnetic fields at each interface could be enforced to obtain recursive relations needed for computing the fields. The larger reflected power was obtained for the structure with thicker strips.
AB - The scattering characteristics of the latest type of strip gratings with layered periodical dielectrical substrate for TE case was analyzed using the mode matching technique. The effects of the strip width and thickness on the scattering characteristics of the periodical structure were calculated and analyzed. The boundary conditions of electric and magnetic fields at each interface could be enforced to obtain recursive relations needed for computing the fields. The larger reflected power was obtained for the structure with thicker strips.
UR - http://www.scopus.com/inward/record.url?scp=0035150091&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0035150091&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0035150091
VL - 4
SP - 398
EP - 401
JO - AP-S International Symposium (Digest) (IEEE Antennas and Propagation Society)
JF - AP-S International Symposium (Digest) (IEEE Antennas and Propagation Society)
SN - 0272-4693
ER -