TY - JOUR
T1 - Rotation angle of magneto-optical Kerr effect with different capping layer on CoFe film
AU - Wu, Kuo Ming
AU - Wang, Jia Feng
AU - Chen, Kuang Ching
AU - Wu, Jong Ching
AU - Horng, Lance
PY - 2007/3/1
Y1 - 2007/3/1
N2 - To understand the influence of rotation angle in magneto-optical effect between conductor and insulator capping layer, we fabricate Co50Fe50/Ta, Co50Fe50/MgO, and Co50Fe50/SiNx bilayers with fixed CoFe thickness and modulated capping layer to systematically study the dependence on the thickness and material of capping layer. We also changed the CoFe thickness with fixed Ta. The switching characteristics were studied using longitudinal magneto-optic Kerr effect (LMOKE) techniques. The hysteresis loops (MH loops) and the coercivity measured by AGM are independent of the capping layer. Our data show the Kerr rotation angle as a function of capping layer thickness. Based on our calculations, the effective rotation angle changes with different capping material. The phenomenon of the increasing Kerr rotation angle is known to be dependent on the dielectric constant and refractive index of the capping layer. A comparison between the rotation angle in LMOKE and the material property has led to a better understanding of the relationship of light refracted in Ta, MgO and SiNx.
AB - To understand the influence of rotation angle in magneto-optical effect between conductor and insulator capping layer, we fabricate Co50Fe50/Ta, Co50Fe50/MgO, and Co50Fe50/SiNx bilayers with fixed CoFe thickness and modulated capping layer to systematically study the dependence on the thickness and material of capping layer. We also changed the CoFe thickness with fixed Ta. The switching characteristics were studied using longitudinal magneto-optic Kerr effect (LMOKE) techniques. The hysteresis loops (MH loops) and the coercivity measured by AGM are independent of the capping layer. Our data show the Kerr rotation angle as a function of capping layer thickness. Based on our calculations, the effective rotation angle changes with different capping material. The phenomenon of the increasing Kerr rotation angle is known to be dependent on the dielectric constant and refractive index of the capping layer. A comparison between the rotation angle in LMOKE and the material property has led to a better understanding of the relationship of light refracted in Ta, MgO and SiNx.
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U2 - 10.1016/j.jmmm.2006.10.997
DO - 10.1016/j.jmmm.2006.10.997
M3 - Article
AN - SCOPUS:33847630713
VL - 310
SP - e944-e946
JO - Journal of Magnetism and Magnetic Materials
JF - Journal of Magnetism and Magnetic Materials
SN - 0304-8853
IS - 2 SUPPL. PART 3
ER -