Abstract
Available online Date This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor-in-Chief. This article has been retracted at the request of the authors. Incorrect data was used in Figure 6 and 8. The data of Fig. 8 disclose the evidence of silicon elements diffusion at the interface that would affect the inference of whole paper. The authors apologize for any inconvenience caused.
Original language | English |
---|---|
Number of pages | 1 |
Journal | Thin Solid Films |
Volume | 665 |
DOIs |
|
Publication status | Published - 2018 Nov 1 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry