Abstract
Available online Date This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor-in-Chief. This article has been retracted at the request of the authors. Incorrect data was used in Figure 6 and 8. The data of Fig. 8 disclose the evidence of silicon elements diffusion at the interface that would affect the inference of whole paper. The authors apologize for any inconvenience caused.
| Original language | English |
|---|---|
| Number of pages | 1 |
| Journal | Thin Solid Films |
| Volume | 665 |
| DOIs |
|
| Publication status | Published - 2018 Nov 1 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry
Cite this
}
RETRACTED : Current Conduction Mechanisms through Au/SnO/n-type Si/In Devices (RETRACTED: Current conduction mechanisms through Au/SnO/n-type Si/In devices (2016) 611 (1–5)(S0040609016301432)(10.1016/j.tsf.2016.05.002)). / Tsao, Hou Yen; Wang, Yu-Wu.
In: Thin Solid Films, Vol. 665, 01.11.2018.Research output: Contribution to journal › Comment/debate
TY - JOUR
T1 - RETRACTED
T2 - Current Conduction Mechanisms through Au/SnO/n-type Si/In Devices (RETRACTED: Current conduction mechanisms through Au/SnO/n-type Si/In devices (2016) 611 (1–5)(S0040609016301432)(10.1016/j.tsf.2016.05.002))
AU - Tsao, Hou Yen
AU - Wang, Yu-Wu
PY - 2018/11/1
Y1 - 2018/11/1
N2 - Available online Date This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor-in-Chief. This article has been retracted at the request of the authors. Incorrect data was used in Figure 6 and 8. The data of Fig. 8 disclose the evidence of silicon elements diffusion at the interface that would affect the inference of whole paper. The authors apologize for any inconvenience caused.
AB - Available online Date This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor-in-Chief. This article has been retracted at the request of the authors. Incorrect data was used in Figure 6 and 8. The data of Fig. 8 disclose the evidence of silicon elements diffusion at the interface that would affect the inference of whole paper. The authors apologize for any inconvenience caused.
UR - http://www.scopus.com/inward/record.url?scp=85054804864&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85054804864&partnerID=8YFLogxK
U2 - 10.1016/j.tsf.2018.03.045
DO - 10.1016/j.tsf.2018.03.045
M3 - Comment/debate
AN - SCOPUS:85054804864
VL - 665
JO - Thin Solid Films
JF - Thin Solid Films
SN - 0040-6090
ER -