RETRACTED: Current Conduction Mechanisms through Au/SnO/n-type Si/In Devices (RETRACTED: Current conduction mechanisms through Au/SnO/n-type Si/In devices (2016) 611 (1–5)(S0040609016301432)(10.1016/j.tsf.2016.05.002))

Available online Date This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor-in-Chief. This article has been retracted at the request of the authors. Incorrect data was used in Figure 6 and 8. The data of Fig. 8 disclose the evidence of silicon elements diffusion at the interface that would affect the inference of whole paper. The authors apologize for any inconvenience caused.