Responsivity to solar irradiation and the behavior of carrier transports for MoS2/Si and MoS2/Si nanowires/Si devices

Cheng You Wu, Yow Jon Lin

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The behavior of carrier transports and the responsivity to solar irradiation are studied for MoS2/n-type Si (n-Si) and MoS2/Si nanowires (SiNWs)/n-Si device. The MoS2 thin films were prepared by the sol–gel method. The MoS2/n-Si and MoS2/SiNWs/n-Si devices exhibit reliable rectification behavior. The thermionic emission-diffusion model is the dominant process in these fabricated MoS2/n-Si and MoS2/SiNWs/n-Si devices. By applying the insertion of the SiNWs, the responsivity to solar irradiation can be effectively increased. Because of the low reflectance values for the MoS2/SiNWs/n-Si sample, the increased photocurrent density for the MoS2/SiNWs/n-Si device is due to high external light injection efficiency. MoS2/SiNWs/n-Si devices benefit from the high surface to volume ratio for SiNWs leading to a high responsivity of the device. The photo-response results confirm that the decay in the photocurrent is due to the dominance of short-lifetime electron trapping in the MoS2 thin film.

Original languageEnglish
Pages (from-to)18331-18336
Number of pages6
JournalJournal of Materials Science: Materials in Electronics
Volume28
Issue number24
DOIs
Publication statusPublished - 2017 Dec 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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