Reliability tests of a RFID-based lock for power meter applications

Kuan-Jung Chung; Chian Wei Jan; Chih Cheng Chen; Sen Chou Tsai

doi:10.1109/IS3C.2012.246

Reliability tests of a RFID-based lock for power meter applications

Kuan-Jung Chung, Chian Wei Jan, Chih Cheng Chen, Sen Chou Tsai

Department of Mechatronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

A novel lock (seal), combined Radio Frequency Identification (RFID) techniques with a smart mechanism, has been developed to improve the anti-thief ability of the traditional mechanical lock (seal) and RFID-based one that we developed in previous work. The reliability validation tests present that RFID locks past all required test conditions including mechanical and environmental tests to demonstrate that RFID is suitable for the defined conditions in use. Furthermore, a thermal cycling test was performed to evaluate the Lifetimes of RFID-based locks. Norris-Landzberg accelerated life model is applied. The results show that the mean life of RFID locks is longer than the required 5 years, and there are 24 RFID locks to fail among 5 years when employing 1 million of them in the market.

Original language	English
Title of host publication	Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012
Pages	945-948
Number of pages	4
DOIs	https://doi.org/10.1109/IS3C.2012.246
Publication status	Published - 2012 Jul 30
Event	2012 International Symposium on Computer, Consumer and Control, IS3C 2012 - Taichung, Taiwan Duration: 2012 Jun 4 → 2012 Jun 6

Publication series

Name	Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012

Other

Other	2012 International Symposium on Computer, Consumer and Control, IS3C 2012
Country	Taiwan
City	Taichung
Period	12-06-04 → 12-06-06

Fingerprint

All Science Journal Classification (ASJC) codes

Computer Networks and Communications

Cite this

Chung, K-J., Jan, C. W., Chen, C. C., & Tsai, S. C. (2012). Reliability tests of a RFID-based lock for power meter applications. In Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012 (pp. 945-948). [6228228] (Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012). https://doi.org/10.1109/IS3C.2012.246

@inproceedings{2c861d873cfa4b0f8ba276320e06d8ba,

title = "Reliability tests of a RFID-based lock for power meter applications",

abstract = "A novel lock (seal), combined Radio Frequency Identification (RFID) techniques with a smart mechanism, has been developed to improve the anti-thief ability of the traditional mechanical lock (seal) and RFID-based one that we developed in previous work. The reliability validation tests present that RFID locks past all required test conditions including mechanical and environmental tests to demonstrate that RFID is suitable for the defined conditions in use. Furthermore, a thermal cycling test was performed to evaluate the Lifetimes of RFID-based locks. Norris-Landzberg accelerated life model is applied. The results show that the mean life of RFID locks is longer than the required 5 years, and there are 24 RFID locks to fail among 5 years when employing 1 million of them in the market.",

author = "Kuan-Jung Chung and Jan, {Chian Wei} and Chen, {Chih Cheng} and Tsai, {Sen Chou}",

year = "2012",

month = "7",

day = "30",

doi = "10.1109/IS3C.2012.246",

language = "English",

isbn = "9780769546551",

series = "Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012",

pages = "945--948",

booktitle = "Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012",

note = "2012 International Symposium on Computer, Consumer and Control, IS3C 2012 ; Conference date: 04-06-2012 Through 06-06-2012",

}

Chung, K-J, Jan, CW, Chen, CC & Tsai, SC 2012, Reliability tests of a RFID-based lock for power meter applications. in Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012., 6228228, Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012, pp. 945-948, 2012 International Symposium on Computer, Consumer and Control, IS3C 2012, Taichung, Taiwan, 12-06-04. https://doi.org/10.1109/IS3C.2012.246

Reliability tests of a RFID-based lock for power meter applications. / Chung, Kuan-Jung; Jan, Chian Wei; Chen, Chih Cheng; Tsai, Sen Chou.

Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012. 2012. p. 945-948 6228228 (Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Reliability tests of a RFID-based lock for power meter applications

AU - Chung, Kuan-Jung

AU - Jan, Chian Wei

AU - Chen, Chih Cheng

AU - Tsai, Sen Chou

PY - 2012/7/30

Y1 - 2012/7/30

N2 - A novel lock (seal), combined Radio Frequency Identification (RFID) techniques with a smart mechanism, has been developed to improve the anti-thief ability of the traditional mechanical lock (seal) and RFID-based one that we developed in previous work. The reliability validation tests present that RFID locks past all required test conditions including mechanical and environmental tests to demonstrate that RFID is suitable for the defined conditions in use. Furthermore, a thermal cycling test was performed to evaluate the Lifetimes of RFID-based locks. Norris-Landzberg accelerated life model is applied. The results show that the mean life of RFID locks is longer than the required 5 years, and there are 24 RFID locks to fail among 5 years when employing 1 million of them in the market.

AB - A novel lock (seal), combined Radio Frequency Identification (RFID) techniques with a smart mechanism, has been developed to improve the anti-thief ability of the traditional mechanical lock (seal) and RFID-based one that we developed in previous work. The reliability validation tests present that RFID locks past all required test conditions including mechanical and environmental tests to demonstrate that RFID is suitable for the defined conditions in use. Furthermore, a thermal cycling test was performed to evaluate the Lifetimes of RFID-based locks. Norris-Landzberg accelerated life model is applied. The results show that the mean life of RFID locks is longer than the required 5 years, and there are 24 RFID locks to fail among 5 years when employing 1 million of them in the market.

UR - http://www.scopus.com/inward/record.url?scp=84864232443&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84864232443&partnerID=8YFLogxK

U2 - 10.1109/IS3C.2012.246

DO - 10.1109/IS3C.2012.246

M3 - Conference contribution

AN - SCOPUS:84864232443

SN - 9780769546551

T3 - Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012

SP - 945

EP - 948

BT - Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012

T2 - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012

Y2 - 4 June 2012 through 6 June 2012

ER -

Access to Document

10.1109/IS3C.2012.246