TY - GEN
T1 - Reliability tests of a RFID-based lock for power meter applications
AU - Chung, Kuan-Jung
AU - Jan, Chian Wei
AU - Chen, Chih Cheng
AU - Tsai, Sen Chou
PY - 2012/7/30
Y1 - 2012/7/30
N2 - A novel lock (seal), combined Radio Frequency Identification (RFID) techniques with a smart mechanism, has been developed to improve the anti-thief ability of the traditional mechanical lock (seal) and RFID-based one that we developed in previous work. The reliability validation tests present that RFID locks past all required test conditions including mechanical and environmental tests to demonstrate that RFID is suitable for the defined conditions in use. Furthermore, a thermal cycling test was performed to evaluate the Lifetimes of RFID-based locks. Norris-Landzberg accelerated life model is applied. The results show that the mean life of RFID locks is longer than the required 5 years, and there are 24 RFID locks to fail among 5 years when employing 1 million of them in the market.
AB - A novel lock (seal), combined Radio Frequency Identification (RFID) techniques with a smart mechanism, has been developed to improve the anti-thief ability of the traditional mechanical lock (seal) and RFID-based one that we developed in previous work. The reliability validation tests present that RFID locks past all required test conditions including mechanical and environmental tests to demonstrate that RFID is suitable for the defined conditions in use. Furthermore, a thermal cycling test was performed to evaluate the Lifetimes of RFID-based locks. Norris-Landzberg accelerated life model is applied. The results show that the mean life of RFID locks is longer than the required 5 years, and there are 24 RFID locks to fail among 5 years when employing 1 million of them in the market.
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U2 - 10.1109/IS3C.2012.246
DO - 10.1109/IS3C.2012.246
M3 - Conference contribution
AN - SCOPUS:84864232443
SN - 9780769546551
T3 - Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012
SP - 945
EP - 948
BT - Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012
T2 - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012
Y2 - 4 June 2012 through 6 June 2012
ER -