Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy

Yu Kai Wang; Yu Chung Chang; Der Yuh Lin

doi:10.23919/MOC46630.2019.8982883

Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy

Yu Kai Wang, Yu Chung Chang, Der Yuh Lin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We present a technique to efficiently identify the thickness and properties of typical 2D materials. By taking microscopic images at a series wavelengths, we obtain reflectance, transmittance and absorption spectra in a single step. We demonstrate using the setup to unambiguously determine the thickness of MoS2 flakes and their excitonic properties.

Original language	English
Title of host publication	MOC 2019 - 24th Microoptics Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	150-151
Number of pages	2
ISBN (Electronic)	9784863487123
DOIs	https://doi.org/10.23919/MOC46630.2019.8982883
Publication status	Published - 2019 Nov
Event	24th Microoptics Conference, MOC 2019 - Toyama, Japan Duration: 2019 Nov 17 → 2019 Nov 20

Publication series

Name	MOC 2019 - 24th Microoptics Conference

Conference

Conference	24th Microoptics Conference, MOC 2019
Country	Japan
City	Toyama
Period	19-11-17 → 19-11-20

Fingerprint

All Science Journal Classification (ASJC) codes

Instrumentation
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Cite this

Wang, Y. K., Chang, Y. C., & Lin, D. Y. (2019). Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy. In MOC 2019 - 24th Microoptics Conference (pp. 150-151). [8982883] (MOC 2019 - 24th Microoptics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/MOC46630.2019.8982883

@inproceedings{6961af5bab7b4a6cbdd6bc2c68dd0041,

title = "Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy",

abstract = "We present a technique to efficiently identify the thickness and properties of typical 2D materials. By taking microscopic images at a series wavelengths, we obtain reflectance, transmittance and absorption spectra in a single step. We demonstrate using the setup to unambiguously determine the thickness of MoS2 flakes and their excitonic properties.",

author = "Wang, {Yu Kai} and Chang, {Yu Chung} and Lin, {Der Yuh}",

year = "2019",

month = nov,

doi = "10.23919/MOC46630.2019.8982883",

language = "English",

series = "MOC 2019 - 24th Microoptics Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "150--151",

booktitle = "MOC 2019 - 24th Microoptics Conference",

address = "United States",

note = "24th Microoptics Conference, MOC 2019 ; Conference date: 17-11-2019 Through 20-11-2019",

}

Wang, YK, Chang, YC & Lin, DY 2019, Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy. in MOC 2019 - 24th Microoptics Conference., 8982883, MOC 2019 - 24th Microoptics Conference, Institute of Electrical and Electronics Engineers Inc., pp. 150-151, 24th Microoptics Conference, MOC 2019, Toyama, Japan, 19-11-17. https://doi.org/10.23919/MOC46630.2019.8982883

Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy. / Wang, Yu Kai; Chang, Yu Chung ; Lin, Der Yuh.

MOC 2019 - 24th Microoptics Conference. Institute of Electrical and Electronics Engineers Inc., 2019. p. 150-151 8982883 (MOC 2019 - 24th Microoptics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy

AU - Wang, Yu Kai

AU - Chang, Yu Chung

AU - Lin, Der Yuh

PY - 2019/11

Y1 - 2019/11

N2 - We present a technique to efficiently identify the thickness and properties of typical 2D materials. By taking microscopic images at a series wavelengths, we obtain reflectance, transmittance and absorption spectra in a single step. We demonstrate using the setup to unambiguously determine the thickness of MoS2 flakes and their excitonic properties.

AB - We present a technique to efficiently identify the thickness and properties of typical 2D materials. By taking microscopic images at a series wavelengths, we obtain reflectance, transmittance and absorption spectra in a single step. We demonstrate using the setup to unambiguously determine the thickness of MoS2 flakes and their excitonic properties.

UR - http://www.scopus.com/inward/record.url?scp=85081105048&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85081105048&partnerID=8YFLogxK

U2 - 10.23919/MOC46630.2019.8982883

DO - 10.23919/MOC46630.2019.8982883

M3 - Conference contribution

T3 - MOC 2019 - 24th Microoptics Conference

SP - 150

EP - 151

BT - MOC 2019 - 24th Microoptics Conference

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 24th Microoptics Conference, MOC 2019

Y2 - 17 November 2019 through 20 November 2019

ER -

Access to Document

10.23919/MOC46630.2019.8982883