Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy

Yu Kai Wang; Yu Chung Chang; Der Yuh Lin

doi:10.23919/MOC46630.2019.8982883

Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy

Yu Kai Wang, Yu Chung Chang, Der Yuh Lin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We present a technique to efficiently identify the thickness and properties of typical 2D materials. By taking microscopic images at a series wavelengths, we obtain reflectance, transmittance and absorption spectra in a single step. We demonstrate using the setup to unambiguously determine the thickness of MoS2 flakes and their excitonic properties.

Original language	English
Title of host publication	MOC 2019 - 24th Microoptics Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	150-151
Number of pages	2
ISBN (Electronic)	9784863487123
DOIs	https://doi.org/10.23919/MOC46630.2019.8982883
Publication status	Published - 2019 Nov
Event	24th Microoptics Conference, MOC 2019 - Toyama, Japan Duration: 2019 Nov 17 → 2019 Nov 20

Publication series

Name	MOC 2019 - 24th Microoptics Conference

Conference

Conference	24th Microoptics Conference, MOC 2019
Country	Japan
City	Toyama
Period	19-11-17 → 19-11-20

All Science Journal Classification (ASJC) codes

Instrumentation
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.23919/MOC46630.2019.8982883

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Cite this

Wang, Y. K., Chang, Y. C., & Lin, D. Y. (2019). Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy. In MOC 2019 - 24th Microoptics Conference (pp. 150-151). [8982883] (MOC 2019 - 24th Microoptics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/MOC46630.2019.8982883

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title = "Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy",

abstract = "We present a technique to efficiently identify the thickness and properties of typical 2D materials. By taking microscopic images at a series wavelengths, we obtain reflectance, transmittance and absorption spectra in a single step. We demonstrate using the setup to unambiguously determine the thickness of MoS2 flakes and their excitonic properties.",

author = "Wang, {Yu Kai} and Chang, {Yu Chung} and Lin, {Der Yuh}",

year = "2019",

month = nov,

doi = "10.23919/MOC46630.2019.8982883",

language = "English",

series = "MOC 2019 - 24th Microoptics Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "150--151",

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note = "24th Microoptics Conference, MOC 2019 ; Conference date: 17-11-2019 Through 20-11-2019",

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Wang, YK, Chang, YC & Lin, DY 2019, Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy. in MOC 2019 - 24th Microoptics Conference., 8982883, MOC 2019 - 24th Microoptics Conference, Institute of Electrical and Electronics Engineers Inc., pp. 150-151, 24th Microoptics Conference, MOC 2019, Toyama, Japan, 19-11-17. https://doi.org/10.23919/MOC46630.2019.8982883

Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy. / Wang, Yu Kai; Chang, Yu Chung ; Lin, Der Yuh.

MOC 2019 - 24th Microoptics Conference. Institute of Electrical and Electronics Engineers Inc., 2019. p. 150-151 8982883 (MOC 2019 - 24th Microoptics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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