Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a technique to efficiently identify the thickness and properties of typical 2D materials. By taking microscopic images at a series wavelengths, we obtain reflectance, transmittance and absorption spectra in a single step. We demonstrate using the setup to unambiguously determine the thickness of MoS2 flakes and their excitonic properties.

Original languageEnglish
Title of host publicationMOC 2019 - 24th Microoptics Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages150-151
Number of pages2
ISBN (Electronic)9784863487123
DOIs
Publication statusPublished - 2019 Nov
Event24th Microoptics Conference, MOC 2019 - Toyama, Japan
Duration: 2019 Nov 172019 Nov 20

Publication series

NameMOC 2019 - 24th Microoptics Conference

Conference

Conference24th Microoptics Conference, MOC 2019
CountryJapan
CityToyama
Period19-11-1719-11-20

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Wang, Y. K., Chang, Y. C., & Lin, D. Y. (2019). Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy. In MOC 2019 - 24th Microoptics Conference (pp. 150-151). [8982883] (MOC 2019 - 24th Microoptics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/MOC46630.2019.8982883