@inproceedings{6961af5bab7b4a6cbdd6bc2c68dd0041,
title = "Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy",
abstract = "We present a technique to efficiently identify the thickness and properties of typical 2D materials. By taking microscopic images at a series wavelengths, we obtain reflectance, transmittance and absorption spectra in a single step. We demonstrate using the setup to unambiguously determine the thickness of MoS2 flakes and their excitonic properties.",
author = "Wang, {Yu Kai} and Chang, {Yu Chung} and Lin, {Der Yuh}",
year = "2019",
month = nov,
doi = "10.23919/MOC46630.2019.8982883",
language = "English",
series = "MOC 2019 - 24th Microoptics Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "150--151",
booktitle = "MOC 2019 - 24th Microoptics Conference",
address = "United States",
note = "24th Microoptics Conference, MOC 2019 ; Conference date: 17-11-2019 Through 20-11-2019",
}