Probing the Magnetization Reversal of Microstructured Permalloy Cross by Planar Hall Measurement and Magnetic Force Microscopy

Y. C. Chang, C. C. Chang, Jong-Ching Wu, Z. H. Wei, M. F. Lai, C. R. Chang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A local magnetization reversal of Permalloy cross has been studied by using magnetoresistance measurement and magnetic force microscope. An extraordinary change of the transverse voltage correlated with the planar Hall Effect was presented and evidenced by a series of MFM images which indicates that the rotation of magnetization within the joint area contributes to the significant voltage alteration.

Original languageEnglish
Pages (from-to)2963-2965
Number of pages3
JournalIEEE Transactions on Magnetics
Volume42
Issue number10
DOIs
Publication statusPublished - 2006 Jan 1

Fingerprint

Magnetic force microscopy
Magnetization reversal
Hall effect
Electric potential
Magnetoresistance
Magnetization
Microscopes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Chang, Y. C. ; Chang, C. C. ; Wu, Jong-Ching ; Wei, Z. H. ; Lai, M. F. ; Chang, C. R. / Probing the Magnetization Reversal of Microstructured Permalloy Cross by Planar Hall Measurement and Magnetic Force Microscopy. In: IEEE Transactions on Magnetics. 2006 ; Vol. 42, No. 10. pp. 2963-2965.
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Probing the Magnetization Reversal of Microstructured Permalloy Cross by Planar Hall Measurement and Magnetic Force Microscopy. / Chang, Y. C.; Chang, C. C.; Wu, Jong-Ching; Wei, Z. H.; Lai, M. F.; Chang, C. R.

In: IEEE Transactions on Magnetics, Vol. 42, No. 10, 01.01.2006, p. 2963-2965.

Research output: Contribution to journalArticle

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