| Original language | English |
|---|---|
| Title of host publication | INTERMAG 2006 - IEEE International Magnetics Conference |
| Number of pages | 1 |
| DOIs | |
| Publication status | Published - 2006 Dec 1 |
| Event | INTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA, United States Duration: 2006 May 8 → 2006 May 12 |
Publication series
| Name | INTERMAG 2006 - IEEE International Magnetics Conference |
|---|
Other
| Other | INTERMAG 2006 - IEEE International Magnetics Conference |
|---|---|
| Country | United States |
| City | San Diego, CA |
| Period | 06-05-08 → 06-05-12 |
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All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
Cite this
}
Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy. / Chang, Y.; Chang, C.; Wu, Jong-Ching; Wei, Z.; Chang, C.
INTERMAG 2006 - IEEE International Magnetics Conference. 2006. 4262374 (INTERMAG 2006 - IEEE International Magnetics Conference).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy
AU - Chang, Y.
AU - Chang, C.
AU - Wu, Jong-Ching
AU - Wei, Z.
AU - Chang, C.
PY - 2006/12/1
Y1 - 2006/12/1
UR - http://www.scopus.com/inward/record.url?scp=50249152910&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=50249152910&partnerID=8YFLogxK
U2 - 10.1109/INTMAG.2006.374972
DO - 10.1109/INTMAG.2006.374972
M3 - Conference contribution
SN - 1424414792
SN - 9781424414796
T3 - INTERMAG 2006 - IEEE International Magnetics Conference
BT - INTERMAG 2006 - IEEE International Magnetics Conference
ER -