Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy

Y. Chang, C. Chang, Jong-Ching Wu, Z. Wei, C. Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationINTERMAG 2006 - IEEE International Magnetics Conference
Number of pages1
DOIs
Publication statusPublished - 2006 Dec 1
EventINTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA, United States
Duration: 2006 May 82006 May 12

Publication series

NameINTERMAG 2006 - IEEE International Magnetics Conference

Other

OtherINTERMAG 2006 - IEEE International Magnetics Conference
CountryUnited States
CitySan Diego, CA
Period06-05-0806-05-12

Fingerprint

Magnetic force microscopy
Magnetization reversal

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Chang, Y., Chang, C., Wu, J-C., Wei, Z., & Chang, C. (2006). Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy. In INTERMAG 2006 - IEEE International Magnetics Conference [4262374] (INTERMAG 2006 - IEEE International Magnetics Conference). https://doi.org/10.1109/INTMAG.2006.374972
Chang, Y. ; Chang, C. ; Wu, Jong-Ching ; Wei, Z. ; Chang, C. / Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy. INTERMAG 2006 - IEEE International Magnetics Conference. 2006. (INTERMAG 2006 - IEEE International Magnetics Conference).
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author = "Y. Chang and C. Chang and Jong-Ching Wu and Z. Wei and C. Chang",
year = "2006",
month = "12",
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doi = "10.1109/INTMAG.2006.374972",
language = "English",
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Chang, Y, Chang, C, Wu, J-C, Wei, Z & Chang, C 2006, Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy. in INTERMAG 2006 - IEEE International Magnetics Conference., 4262374, INTERMAG 2006 - IEEE International Magnetics Conference, INTERMAG 2006 - IEEE International Magnetics Conference, San Diego, CA, United States, 06-05-08. https://doi.org/10.1109/INTMAG.2006.374972

Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy. / Chang, Y.; Chang, C.; Wu, Jong-Ching; Wei, Z.; Chang, C.

INTERMAG 2006 - IEEE International Magnetics Conference. 2006. 4262374 (INTERMAG 2006 - IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy

AU - Chang, Y.

AU - Chang, C.

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AU - Wei, Z.

AU - Chang, C.

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M3 - Conference contribution

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SN - 1424414792

SN - 9781424414796

T3 - INTERMAG 2006 - IEEE International Magnetics Conference

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Chang Y, Chang C, Wu J-C, Wei Z, Chang C. Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy. In INTERMAG 2006 - IEEE International Magnetics Conference. 2006. 4262374. (INTERMAG 2006 - IEEE International Magnetics Conference). https://doi.org/10.1109/INTMAG.2006.374972