Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy

Y. Chang; C. Chang; Jong-Ching Wu; Z. Wei; C. Chang

doi:10.1109/INTMAG.2006.374972

Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy

Y. Chang, C. Chang, Jong-Ching Wu, Z. Wei, C. Chang

Department of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	INTERMAG 2006 - IEEE International Magnetics Conference
Number of pages	1
DOIs	https://doi.org/10.1109/INTMAG.2006.374972
Publication status	Published - 2006 Dec 1
Event	INTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA, United States Duration: 2006 May 8 → 2006 May 12

Publication series

Name	INTERMAG 2006 - IEEE International Magnetics Conference

Other

Other	INTERMAG 2006 - IEEE International Magnetics Conference
Country	United States
City	San Diego, CA
Period	06-05-08 → 06-05-12

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/INTMAG.2006.374972

Cite this

@inproceedings{1425ee0e1733495e80b23d30964ba129,

title = "Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy",

author = "Y. Chang and C. Chang and Jong-Ching Wu and Z. Wei and C. Chang",

year = "2006",

month = dec,

day = "1",

doi = "10.1109/INTMAG.2006.374972",

language = "English",

isbn = "1424414792",

series = "INTERMAG 2006 - IEEE International Magnetics Conference",

booktitle = "INTERMAG 2006 - IEEE International Magnetics Conference",

note = "INTERMAG 2006 - IEEE International Magnetics Conference ; Conference date: 08-05-2006 Through 12-05-2006",

}

Chang, Y, Chang, C, Wu, J-C, Wei, Z & Chang, C 2006, Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy. in INTERMAG 2006 - IEEE International Magnetics Conference., 4262374, INTERMAG 2006 - IEEE International Magnetics Conference, INTERMAG 2006 - IEEE International Magnetics Conference, San Diego, CA, United States, 06-05-08. https://doi.org/10.1109/INTMAG.2006.374972

Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy. / Chang, Y.; Chang, C.; Wu, Jong-Ching; Wei, Z.; Chang, C.

INTERMAG 2006 - IEEE International Magnetics Conference. 2006. 4262374 (INTERMAG 2006 - IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy

AU - Chang, Y.

AU - Chang, C.

AU - Wu, Jong-Ching

AU - Wei, Z.

AU - Chang, C.

PY - 2006/12/1

Y1 - 2006/12/1

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U2 - 10.1109/INTMAG.2006.374972

DO - 10.1109/INTMAG.2006.374972

M3 - Conference contribution

AN - SCOPUS:50249152910

SN - 1424414792

SN - 9781424414796

T3 - INTERMAG 2006 - IEEE International Magnetics Conference

BT - INTERMAG 2006 - IEEE International Magnetics Conference

T2 - INTERMAG 2006 - IEEE International Magnetics Conference

Y2 - 8 May 2006 through 12 May 2006

ER -