Abstract
Polarized infrared (IR) reflectance measurement was carried out to investigate the optical phonon modes of wurtzite structure In0.92Ga0.08N thin film grown by molecular beam epitaxy. Composition dependence of IR reststrahlen features was observed. Theoretical polarized IR reflectance spectrum was simulated using the standard multilayer optics technique with a multioscillator dielectric function model. By obtaining the best fit of experimental and theoretical spectrum, the Brillouin zone center E1 optical phonon modes together with the dielectric constant, layer thickness, free carriers concentration and mobility were extracted non-destructively. The extracted E1 optical phonon modes were compared with those generated from modified random element iso-displacement (MREI) model.
| Original language | English |
|---|---|
| Title of host publication | Main Tendencies in Applied Materials Science |
| Publisher | Trans Tech Publications Ltd |
| Pages | 614-619 |
| Number of pages | 6 |
| ISBN (Print) | 9783038357520 |
| DOIs | |
| Publication status | Published - 2016 Jan 1 |
| Event | 28th Regional Conference on Solid State Science and Technology, RCSSST 2014 - Cameron Highlands, Pahang, Malaysia Duration: 2014 Nov 25 → 2014 Nov 27 |
Publication series
| Name | Materials Science Forum |
|---|---|
| Volume | 846 |
| ISSN (Print) | 0255-5476 |
Other
| Other | 28th Regional Conference on Solid State Science and Technology, RCSSST 2014 |
|---|---|
| Country | Malaysia |
| City | Cameron Highlands, Pahang |
| Period | 14-11-25 → 14-11-27 |
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All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
Cite this
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Polarized infrared reststrahlen features of wurtzite inGaN thin film. / Yew, Pauline; Cheong, Lee Sai; Shiong, Ng Sha; Leong, Yoon Tiem; Abu Hassan, Haslan; Chen, Wei-Li.
Main Tendencies in Applied Materials Science. Trans Tech Publications Ltd, 2016. p. 614-619 (Materials Science Forum; Vol. 846).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Polarized infrared reststrahlen features of wurtzite inGaN thin film
AU - Yew, Pauline
AU - Cheong, Lee Sai
AU - Shiong, Ng Sha
AU - Leong, Yoon Tiem
AU - Abu Hassan, Haslan
AU - Chen, Wei-Li
PY - 2016/1/1
Y1 - 2016/1/1
N2 - Polarized infrared (IR) reflectance measurement was carried out to investigate the optical phonon modes of wurtzite structure In0.92Ga0.08N thin film grown by molecular beam epitaxy. Composition dependence of IR reststrahlen features was observed. Theoretical polarized IR reflectance spectrum was simulated using the standard multilayer optics technique with a multioscillator dielectric function model. By obtaining the best fit of experimental and theoretical spectrum, the Brillouin zone center E1 optical phonon modes together with the dielectric constant, layer thickness, free carriers concentration and mobility were extracted non-destructively. The extracted E1 optical phonon modes were compared with those generated from modified random element iso-displacement (MREI) model.
AB - Polarized infrared (IR) reflectance measurement was carried out to investigate the optical phonon modes of wurtzite structure In0.92Ga0.08N thin film grown by molecular beam epitaxy. Composition dependence of IR reststrahlen features was observed. Theoretical polarized IR reflectance spectrum was simulated using the standard multilayer optics technique with a multioscillator dielectric function model. By obtaining the best fit of experimental and theoretical spectrum, the Brillouin zone center E1 optical phonon modes together with the dielectric constant, layer thickness, free carriers concentration and mobility were extracted non-destructively. The extracted E1 optical phonon modes were compared with those generated from modified random element iso-displacement (MREI) model.
UR - http://www.scopus.com/inward/record.url?scp=84959905861&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84959905861&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/MSF.846.614
DO - 10.4028/www.scientific.net/MSF.846.614
M3 - Conference contribution
AN - SCOPUS:84959905861
SN - 9783038357520
T3 - Materials Science Forum
SP - 614
EP - 619
BT - Main Tendencies in Applied Materials Science
PB - Trans Tech Publications Ltd
ER -