Polarized infrared reststrahlen features of wurtzite inGaN thin film

Pauline Yew, Lee Sai Cheong, Ng Sha Shiong, Yoon Tiem Leong, Haslan Abu Hassan, Wei Li Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Polarized infrared (IR) reflectance measurement was carried out to investigate the optical phonon modes of wurtzite structure In0.92Ga0.08N thin film grown by molecular beam epitaxy. Composition dependence of IR reststrahlen features was observed. Theoretical polarized IR reflectance spectrum was simulated using the standard multilayer optics technique with a multioscillator dielectric function model. By obtaining the best fit of experimental and theoretical spectrum, the Brillouin zone center E1 optical phonon modes together with the dielectric constant, layer thickness, free carriers concentration and mobility were extracted non-destructively. The extracted E1 optical phonon modes were compared with those generated from modified random element iso-displacement (MREI) model.

Original languageEnglish
Title of host publicationMain Tendencies in Applied Materials Science
EditorsH. Azhan, K. Azman, Nafisah Osman, Oskar Hasdinor Hassan, R. Abd-Shukor, Mohamad Deraman, W. Kong, Z. Aspanut, M.K. Halimah, Rabaah Syahidah Azis, Rabaah Syahidah Azis, M.R. Sahar, S.A. Halim
PublisherTrans Tech Publications Ltd
Number of pages6
ISBN (Print)9783038357520
Publication statusPublished - 2016
Event28th Regional Conference on Solid State Science and Technology, RCSSST 2014 - Cameron Highlands, Pahang, Malaysia
Duration: 2014 Nov 252014 Nov 27

Publication series

NameMaterials Science Forum
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752


Other28th Regional Conference on Solid State Science and Technology, RCSSST 2014
CityCameron Highlands, Pahang

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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