Optical characterization of ZnMnO thin films on c-Al2O 3

H. J. Lin; D. Y. Lin; J. S. Wu; W. C. Chou; C. S. Yang; J. S. Wang; W. H. Lo

doi:10.3938/jkps.53.98

Optical characterization of ZnMnO thin films on c-Al₂O ₃

H. J. Lin, D. Y. Lin, J. S. Wu, W. C. Chou, C. S. Yang, J. S. Wang, W. H. Lo

Department of Electronic Engineering

Research output: Contribution to journal › Article

2 Citations (Scopus)

Abstract

Various optical measurement technologies have been used to characterize ZnMnO thin films with different Mn compositions grown by molecular beam epitaxy (MBE) on c-Al₂O₃ substrates. The lattice constant and the crystalization quality have been evaluated by using X-ray diffraction (XRD). Photoluminescence (PL) has been used to reveal the neutral-donor-bound exciton (D⁰X) and to check the film's quality. Defect-related absorption signatures, in addition to near-band-edge absorption, due to the zinc vacancy and the donor-acceptor pair (DAP) have been found in the surface photovoltage spectra (SPS). Free excitonic transitions and their phonon-assisted replicas have been observed in the reflectance spectra. Our experimental results not only unveil specific optical transition energies but also indicate a rapid material deterioration when Mn incorporation goes beyond a certain amount to cause manganese segregation.

Original language	English
Pages (from-to)	98-101
Number of pages	4
Journal	Journal of the Korean Physical Society
Volume	53
Issue number	1
DOIs	https://doi.org/10.3938/jkps.53.98
Publication status	Published - 2008 Jul

All Science Journal Classification (ASJC) codes

Physics and Astronomy(all)

Access to Document

10.3938/jkps.53.98

Fingerprint Dive into the research topics of 'Optical characterization of ZnMnO thin films on c-Al<sub>2</sub>O <sub>3</sub>'. Together they form a unique fingerprint.

Cite this

Lin, H. J., Lin, D. Y., Wu, J. S., Chou, W. C., Yang, C. S., Wang, J. S., & Lo, W. H. (2008). Optical characterization of ZnMnO thin films on c-Al₂O ₃. Journal of the Korean Physical Society, 53(1), 98-101. https://doi.org/10.3938/jkps.53.98

@article{5ebcf89ec6d048c88d4384969a305616,

title = "Optical characterization of ZnMnO thin films on c-Al2O 3",

abstract = "Various optical measurement technologies have been used to characterize ZnMnO thin films with different Mn compositions grown by molecular beam epitaxy (MBE) on c-Al2O3 substrates. The lattice constant and the crystalization quality have been evaluated by using X-ray diffraction (XRD). Photoluminescence (PL) has been used to reveal the neutral-donor-bound exciton (D0X) and to check the film's quality. Defect-related absorption signatures, in addition to near-band-edge absorption, due to the zinc vacancy and the donor-acceptor pair (DAP) have been found in the surface photovoltage spectra (SPS). Free excitonic transitions and their phonon-assisted replicas have been observed in the reflectance spectra. Our experimental results not only unveil specific optical transition energies but also indicate a rapid material deterioration when Mn incorporation goes beyond a certain amount to cause manganese segregation.",

author = "Lin, {H. J.} and Lin, {D. Y.} and Wu, {J. S.} and Chou, {W. C.} and Yang, {C. S.} and Wang, {J. S.} and Lo, {W. H.}",

year = "2008",

month = jul,

doi = "10.3938/jkps.53.98",

language = "English",

volume = "53",

pages = "98--101",

journal = "Journal of the Korean Physical Society",

issn = "0374-4884",

publisher = "Korean Physical Society",

number = "1",

}

TY - JOUR

T1 - Optical characterization of ZnMnO thin films on c-Al2O 3

AU - Lin, H. J.

AU - Lin, D. Y.

AU - Wu, J. S.

AU - Chou, W. C.

AU - Yang, C. S.

AU - Wang, J. S.

AU - Lo, W. H.

PY - 2008/7

Y1 - 2008/7

N2 - Various optical measurement technologies have been used to characterize ZnMnO thin films with different Mn compositions grown by molecular beam epitaxy (MBE) on c-Al2O3 substrates. The lattice constant and the crystalization quality have been evaluated by using X-ray diffraction (XRD). Photoluminescence (PL) has been used to reveal the neutral-donor-bound exciton (D0X) and to check the film's quality. Defect-related absorption signatures, in addition to near-band-edge absorption, due to the zinc vacancy and the donor-acceptor pair (DAP) have been found in the surface photovoltage spectra (SPS). Free excitonic transitions and their phonon-assisted replicas have been observed in the reflectance spectra. Our experimental results not only unveil specific optical transition energies but also indicate a rapid material deterioration when Mn incorporation goes beyond a certain amount to cause manganese segregation.

AB - Various optical measurement technologies have been used to characterize ZnMnO thin films with different Mn compositions grown by molecular beam epitaxy (MBE) on c-Al2O3 substrates. The lattice constant and the crystalization quality have been evaluated by using X-ray diffraction (XRD). Photoluminescence (PL) has been used to reveal the neutral-donor-bound exciton (D0X) and to check the film's quality. Defect-related absorption signatures, in addition to near-band-edge absorption, due to the zinc vacancy and the donor-acceptor pair (DAP) have been found in the surface photovoltage spectra (SPS). Free excitonic transitions and their phonon-assisted replicas have been observed in the reflectance spectra. Our experimental results not only unveil specific optical transition energies but also indicate a rapid material deterioration when Mn incorporation goes beyond a certain amount to cause manganese segregation.

UR - http://www.scopus.com/inward/record.url?scp=49649091583&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=49649091583&partnerID=8YFLogxK

U2 - 10.3938/jkps.53.98

DO - 10.3938/jkps.53.98

M3 - Article

AN - SCOPUS:49649091583

VL - 53

SP - 98

EP - 101

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

SN - 0374-4884

IS - 1

ER -