Abstract
Various optical measurement technologies have been used to characterize ZnMnO thin films with different Mn compositions grown by molecular beam epitaxy (MBE) on c-Al2O3 substrates. The lattice constant and the crystalization quality have been evaluated by using X-ray diffraction (XRD). Photoluminescence (PL) has been used to reveal the neutral-donor-bound exciton (D0X) and to check the film's quality. Defect-related absorption signatures, in addition to near-band-edge absorption, due to the zinc vacancy and the donor-acceptor pair (DAP) have been found in the surface photovoltage spectra (SPS). Free excitonic transitions and their phonon-assisted replicas have been observed in the reflectance spectra. Our experimental results not only unveil specific optical transition energies but also indicate a rapid material deterioration when Mn incorporation goes beyond a certain amount to cause manganese segregation.
| Original language | English |
|---|---|
| Pages (from-to) | 98-101 |
| Number of pages | 4 |
| Journal | Journal of the Korean Physical Society |
| Volume | 53 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2008 Jan 1 |
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All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)
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Optical characterization of ZnMnO thin films on c-Al2O 3 . / Lin, H. J.; Lin, Der-Yuh; Wu, Jenq-Shinn; Chou, W. C.; Yang, C. S.; Wang, J. S.; Lo, W. H.
In: Journal of the Korean Physical Society, Vol. 53, No. 1, 01.01.2008, p. 98-101.Research output: Contribution to journal › Article
TY - JOUR
T1 - Optical characterization of ZnMnO thin films on c-Al2O 3
AU - Lin, H. J.
AU - Lin, Der-Yuh
AU - Wu, Jenq-Shinn
AU - Chou, W. C.
AU - Yang, C. S.
AU - Wang, J. S.
AU - Lo, W. H.
PY - 2008/1/1
Y1 - 2008/1/1
N2 - Various optical measurement technologies have been used to characterize ZnMnO thin films with different Mn compositions grown by molecular beam epitaxy (MBE) on c-Al2O3 substrates. The lattice constant and the crystalization quality have been evaluated by using X-ray diffraction (XRD). Photoluminescence (PL) has been used to reveal the neutral-donor-bound exciton (D0X) and to check the film's quality. Defect-related absorption signatures, in addition to near-band-edge absorption, due to the zinc vacancy and the donor-acceptor pair (DAP) have been found in the surface photovoltage spectra (SPS). Free excitonic transitions and their phonon-assisted replicas have been observed in the reflectance spectra. Our experimental results not only unveil specific optical transition energies but also indicate a rapid material deterioration when Mn incorporation goes beyond a certain amount to cause manganese segregation.
AB - Various optical measurement technologies have been used to characterize ZnMnO thin films with different Mn compositions grown by molecular beam epitaxy (MBE) on c-Al2O3 substrates. The lattice constant and the crystalization quality have been evaluated by using X-ray diffraction (XRD). Photoluminescence (PL) has been used to reveal the neutral-donor-bound exciton (D0X) and to check the film's quality. Defect-related absorption signatures, in addition to near-band-edge absorption, due to the zinc vacancy and the donor-acceptor pair (DAP) have been found in the surface photovoltage spectra (SPS). Free excitonic transitions and their phonon-assisted replicas have been observed in the reflectance spectra. Our experimental results not only unveil specific optical transition energies but also indicate a rapid material deterioration when Mn incorporation goes beyond a certain amount to cause manganese segregation.
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U2 - 10.3938/jkps.53.98
DO - 10.3938/jkps.53.98
M3 - Article
AN - SCOPUS:49649091583
VL - 53
SP - 98
EP - 101
JO - Journal of the Korean Physical Society
JF - Journal of the Korean Physical Society
SN - 0374-4884
IS - 1
ER -