TY - GEN
T1 - On-wafer measurement setups for on-chip antennas fabricated on silicon substrates
AU - Lin, Jau
AU - Sugavanam, Aravind
AU - Gao, Li
AU - Brewer, Joe E.
AU - Kenneth, K. O.
PY - 2004/1/1
Y1 - 2004/1/1
N2 - This paper presents the measurement setups of on-chip antennas for short range communications over free space (μNode applications). To evaluate the on-chip antenna characteristics in realistic indoor and outdoor operating environments, two mobile microwave probe stands have been constructed using Delrin (a type of plastic, ε ∼3.7). Each stand is equipped with a probe holder and a cable connection to a test instrument. The stands can be connected with a network analyzer for 1-port or 2-port S-parameter measurements. By connecting a spectrum analyzer and a signal generator to these mobile probe stands, power gains between a pair of antennas as function of separation can be measured. Simulation and measurement results suggest that the effects of probe stands on antenna characteristics are small.
AB - This paper presents the measurement setups of on-chip antennas for short range communications over free space (μNode applications). To evaluate the on-chip antenna characteristics in realistic indoor and outdoor operating environments, two mobile microwave probe stands have been constructed using Delrin (a type of plastic, ε ∼3.7). Each stand is equipped with a probe holder and a cable connection to a test instrument. The stands can be connected with a network analyzer for 1-port or 2-port S-parameter measurements. By connecting a spectrum analyzer and a signal generator to these mobile probe stands, power gains between a pair of antennas as function of separation can be measured. Simulation and measurement results suggest that the effects of probe stands on antenna characteristics are small.
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U2 - 10.1109/ARFTGF.2004.1427604
DO - 10.1109/ARFTGF.2004.1427604
M3 - Conference contribution
AN - SCOPUS:33947388291
T3 - 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004
SP - 221
EP - 225
BT - 64th ARFTG Microwave Measurements Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004
Y2 - 2 December 2004 through 3 December 2004
ER -