On-wafer measurement setups for on-chip antennas fabricated on silicon substrates

Jau Lin, Aravind Sugavanam, Li Gao, Joe E. Brewer, K. O. Kenneth

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

This paper presents the measurement setups of on-chip antennas for short range communications over free space (μNode applications). To evaluate the on-chip antenna characteristics in realistic indoor and outdoor operating environments, two mobile microwave probe stands have been constructed using Delrin (a type of plastic, ε ∼3.7). Each stand is equipped with a probe holder and a cable connection to a test instrument. The stands can be connected with a network analyzer for 1-port or 2-port S-parameter measurements. By connecting a spectrum analyzer and a signal generator to these mobile probe stands, power gains between a pair of antennas as function of separation can be measured. Simulation and measurement results suggest that the effects of probe stands on antenna characteristics are small.

Original languageEnglish
Title of host publication64th ARFTG Microwave Measurements Conference
Subtitle of host publicationDigital Communications Systems Metrics, ARFTG 2004
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages221-225
Number of pages5
ISBN (Electronic)0780389522, 9780780389526
DOIs
Publication statusPublished - 2004 Jan 1
Event64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004 - Orlando, United States
Duration: 2004 Dec 22004 Dec 3

Publication series

Name64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004

Other

Other64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004
CountryUnited States
CityOrlando
Period04-12-0204-12-03

Fingerprint

Antennas
Silicon
Substrates
Signal generators
Spectrum analyzers
Electric network analyzers
Scattering parameters
Cables
Microwaves
Plastics
Communication

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Lin, J., Sugavanam, A., Gao, L., Brewer, J. E., & Kenneth, K. O. (2004). On-wafer measurement setups for on-chip antennas fabricated on silicon substrates. In 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004 (pp. 221-225). [1427604] (64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ARFTGF.2004.1427604
Lin, Jau ; Sugavanam, Aravind ; Gao, Li ; Brewer, Joe E. ; Kenneth, K. O. / On-wafer measurement setups for on-chip antennas fabricated on silicon substrates. 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004. Institute of Electrical and Electronics Engineers Inc., 2004. pp. 221-225 (64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004).
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abstract = "This paper presents the measurement setups of on-chip antennas for short range communications over free space (μNode applications). To evaluate the on-chip antenna characteristics in realistic indoor and outdoor operating environments, two mobile microwave probe stands have been constructed using Delrin (a type of plastic, ε ∼3.7). Each stand is equipped with a probe holder and a cable connection to a test instrument. The stands can be connected with a network analyzer for 1-port or 2-port S-parameter measurements. By connecting a spectrum analyzer and a signal generator to these mobile probe stands, power gains between a pair of antennas as function of separation can be measured. Simulation and measurement results suggest that the effects of probe stands on antenna characteristics are small.",
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Lin, J, Sugavanam, A, Gao, L, Brewer, JE & Kenneth, KO 2004, On-wafer measurement setups for on-chip antennas fabricated on silicon substrates. in 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004., 1427604, 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004, Institute of Electrical and Electronics Engineers Inc., pp. 221-225, 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004, Orlando, United States, 04-12-02. https://doi.org/10.1109/ARFTGF.2004.1427604

On-wafer measurement setups for on-chip antennas fabricated on silicon substrates. / Lin, Jau; Sugavanam, Aravind; Gao, Li; Brewer, Joe E.; Kenneth, K. O.

64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004. Institute of Electrical and Electronics Engineers Inc., 2004. p. 221-225 1427604 (64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Lin J, Sugavanam A, Gao L, Brewer JE, Kenneth KO. On-wafer measurement setups for on-chip antennas fabricated on silicon substrates. In 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004. Institute of Electrical and Electronics Engineers Inc. 2004. p. 221-225. 1427604. (64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004). https://doi.org/10.1109/ARFTGF.2004.1427604