On-wafer measurement setups for on-chip antennas fabricated on silicon substrates

Jau Lin; Aravind Sugavanam; Li Gao; Joe E. Brewer; K. O. Kenneth

doi:10.1109/ARFTGF.2004.1427604

On-wafer measurement setups for on-chip antennas fabricated on silicon substrates

Jau Lin, Aravind Sugavanam, Li Gao, Joe E. Brewer, K. O. Kenneth

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Citations (Scopus)

Abstract

This paper presents the measurement setups of on-chip antennas for short range communications over free space (μNode applications). To evaluate the on-chip antenna characteristics in realistic indoor and outdoor operating environments, two mobile microwave probe stands have been constructed using Delrin (a type of plastic, ε ∼3.7). Each stand is equipped with a probe holder and a cable connection to a test instrument. The stands can be connected with a network analyzer for 1-port or 2-port S-parameter measurements. By connecting a spectrum analyzer and a signal generator to these mobile probe stands, power gains between a pair of antennas as function of separation can be measured. Simulation and measurement results suggest that the effects of probe stands on antenna characteristics are small.

Original language	English
Title of host publication	64th ARFTG Microwave Measurements Conference
Subtitle of host publication	Digital Communications Systems Metrics, ARFTG 2004
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	221-225
Number of pages	5
ISBN (Electronic)	0780389522, 9780780389526
DOIs	https://doi.org/10.1109/ARFTGF.2004.1427604
Publication status	Published - 2004 Jan 1
Event	64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004 - Orlando, United States Duration: 2004 Dec 2 → 2004 Dec 3

Publication series

Name	64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004

Other

Other	64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004
Country	United States
City	Orlando
Period	04-12-02 → 04-12-03

All Science Journal Classification (ASJC) codes

Engineering(all)

Access to Document

10.1109/ARFTGF.2004.1427604

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Lin, J., Sugavanam, A., Gao, L., Brewer, J. E., & Kenneth, K. O. (2004). On-wafer measurement setups for on-chip antennas fabricated on silicon substrates. In 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004 (pp. 221-225). [1427604] (64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ARFTGF.2004.1427604

Lin, Jau ; Sugavanam, Aravind ; Gao, Li ; Brewer, Joe E. ; Kenneth, K. O. / On-wafer measurement setups for on-chip antennas fabricated on silicon substrates. 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004. Institute of Electrical and Electronics Engineers Inc., 2004. pp. 221-225 (64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004).

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abstract = "This paper presents the measurement setups of on-chip antennas for short range communications over free space (μNode applications). To evaluate the on-chip antenna characteristics in realistic indoor and outdoor operating environments, two mobile microwave probe stands have been constructed using Delrin (a type of plastic, ε ∼3.7). Each stand is equipped with a probe holder and a cable connection to a test instrument. The stands can be connected with a network analyzer for 1-port or 2-port S-parameter measurements. By connecting a spectrum analyzer and a signal generator to these mobile probe stands, power gains between a pair of antennas as function of separation can be measured. Simulation and measurement results suggest that the effects of probe stands on antenna characteristics are small.",

author = "Jau Lin and Aravind Sugavanam and Li Gao and Brewer, {Joe E.} and Kenneth, {K. O.}",

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Lin, J, Sugavanam, A, Gao, L, Brewer, JE & Kenneth, KO 2004, On-wafer measurement setups for on-chip antennas fabricated on silicon substrates. in 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004., 1427604, 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004, Institute of Electrical and Electronics Engineers Inc., pp. 221-225, 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004, Orlando, United States, 04-12-02. https://doi.org/10.1109/ARFTGF.2004.1427604

On-wafer measurement setups for on-chip antennas fabricated on silicon substrates. / Lin, Jau; Sugavanam, Aravind; Gao, Li; Brewer, Joe E.; Kenneth, K. O.

64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004. Institute of Electrical and Electronics Engineers Inc., 2004. p. 221-225 1427604 (64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - This paper presents the measurement setups of on-chip antennas for short range communications over free space (μNode applications). To evaluate the on-chip antenna characteristics in realistic indoor and outdoor operating environments, two mobile microwave probe stands have been constructed using Delrin (a type of plastic, ε ∼3.7). Each stand is equipped with a probe holder and a cable connection to a test instrument. The stands can be connected with a network analyzer for 1-port or 2-port S-parameter measurements. By connecting a spectrum analyzer and a signal generator to these mobile probe stands, power gains between a pair of antennas as function of separation can be measured. Simulation and measurement results suggest that the effects of probe stands on antenna characteristics are small.

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Lin J, Sugavanam A, Gao L, Brewer JE, Kenneth KO. On-wafer measurement setups for on-chip antennas fabricated on silicon substrates. In 64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004. Institute of Electrical and Electronics Engineers Inc. 2004. p. 221-225. 1427604. (64th ARFTG Microwave Measurements Conference: Digital Communications Systems Metrics, ARFTG 2004). https://doi.org/10.1109/ARFTGF.2004.1427604