On the tail probability of the longest well-matching run

C. J. Chang, C. S.J. Fann, W. C. Chou, I. B. Lian

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The distribution of the length of the longest run has wide applications in regard to reliability and DNA sequencing. Statistical tests based on the longest well-matching run are usually considered to be more reasonable than tests based on the perfect-matching run. In this paper, a method adopted from Fu and Koutras (J. Amer. Statist. Assoc. 89 (1994) 1050) is proposed to improve the efficiency of computing the exact distribution of length. We used the result to investigate the accuracy of some approximations of the distribution.

Original languageEnglish
Pages (from-to)267-274
Number of pages8
JournalStatistics and Probability Letters
Volume63
Issue number3
DOIs
Publication statusPublished - 2003 Jul 1

All Science Journal Classification (ASJC) codes

  • Statistics and Probability
  • Statistics, Probability and Uncertainty

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