On the tail probability of the longest well-matching run

C. J. Chang; C. S.J. Fann; W. C. Chou; I. B. Lian

doi:10.1016/S0167-7152(03)00091-9

On the tail probability of the longest well-matching run

C. J. Chang, C. S.J. Fann, W. C. Chou, I. B. Lian

Graduate Institute of Statistics and Information Science

Research output: Contribution to journal › Article

4 Citations (Scopus)

Abstract

The distribution of the length of the longest run has wide applications in regard to reliability and DNA sequencing. Statistical tests based on the longest well-matching run are usually considered to be more reasonable than tests based on the perfect-matching run. In this paper, a method adopted from Fu and Koutras (J. Amer. Statist. Assoc. 89 (1994) 1050) is proposed to improve the efficiency of computing the exact distribution of length. We used the result to investigate the accuracy of some approximations of the distribution.

Original language	English
Pages (from-to)	267-274
Number of pages	8
Journal	Statistics and Probability Letters
Volume	63
Issue number	3
DOIs	https://doi.org/10.1016/S0167-7152(03)00091-9
Publication status	Published - 2003 Jul 1

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All Science Journal Classification (ASJC) codes

Statistics and Probability
Statistics, Probability and Uncertainty

Cite this

Chang, C. J., Fann, C. S. J., Chou, W. C., & Lian, I. B. (2003). On the tail probability of the longest well-matching run. Statistics and Probability Letters, 63(3), 267-274. https://doi.org/10.1016/S0167-7152(03)00091-9

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10.1016/S0167-7152(03)00091-9