Abstract
Magnetic domain configurations of microstructured permalloy exchange coupled by an antiferromagnetic (NiO) thin film is presented. NiO/NiFe bilayer micrometer array elements were fabricated using electron beam lithography through a lift-off technique. The magnetic force microscopy images of the elliptical and rectangular elements with various aspect ratios showed dipole-like magnetic domain structures. The bright/dark arc contrast associated with the magnetic pole strength was dependent on the anisotropic exchange field. Furthermore, the shape anisotropy can overwhelm anisotropic exchange in patterned elements with a high aspect ratio and thicker permalloy film.
Original language | English |
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Pages (from-to) | 4948-4950 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 87 |
Issue number | 9 II |
DOIs | |
Publication status | Published - 2000 May |
Event | 44th Annual Conference on Magnetism and Magnetic Materials - San Jose, CA, United States Duration: 1999 Nov 15 → 1999 Nov 18 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)