Abstract
Magnetic domain configurations of microstructured permalloy exchange coupled by an antiferromagnetic (NiO) thin film is presented. NiO/NiFe bilayer micrometer array elements were fabricated using electron beam lithography through a lift-off technique. The magnetic force microscopy images of the elliptical and rectangular elements with various aspect ratios showed dipole-like magnetic domain structures. The bright/dark arc contrast associated with the magnetic pole strength was dependent on the anisotropic exchange field. Furthermore, the shape anisotropy can overwhelm anisotropic exchange in patterned elements with a high aspect ratio and thicker permalloy film.
| Original language | English |
|---|---|
| Pages (from-to) | 4948-4950 |
| Number of pages | 3 |
| Journal | Journal of Applied Physics |
| Volume | 87 |
| Issue number | 9 II |
| Publication status | Published - 2000 May 1 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)
Cite this
}
Monodomain configurations due to bias effect in NiO/NiFe microstructures. / Wu, Jong-Ching; Huang, H. W.; Lai, Chih Huang; Wu, Te Ho.
In: Journal of Applied Physics, Vol. 87, No. 9 II, 01.05.2000, p. 4948-4950.Research output: Contribution to journal › Article
TY - JOUR
T1 - Monodomain configurations due to bias effect in NiO/NiFe microstructures
AU - Wu, Jong-Ching
AU - Huang, H. W.
AU - Lai, Chih Huang
AU - Wu, Te Ho
PY - 2000/5/1
Y1 - 2000/5/1
N2 - Magnetic domain configurations of microstructured permalloy exchange coupled by an antiferromagnetic (NiO) thin film is presented. NiO/NiFe bilayer micrometer array elements were fabricated using electron beam lithography through a lift-off technique. The magnetic force microscopy images of the elliptical and rectangular elements with various aspect ratios showed dipole-like magnetic domain structures. The bright/dark arc contrast associated with the magnetic pole strength was dependent on the anisotropic exchange field. Furthermore, the shape anisotropy can overwhelm anisotropic exchange in patterned elements with a high aspect ratio and thicker permalloy film.
AB - Magnetic domain configurations of microstructured permalloy exchange coupled by an antiferromagnetic (NiO) thin film is presented. NiO/NiFe bilayer micrometer array elements were fabricated using electron beam lithography through a lift-off technique. The magnetic force microscopy images of the elliptical and rectangular elements with various aspect ratios showed dipole-like magnetic domain structures. The bright/dark arc contrast associated with the magnetic pole strength was dependent on the anisotropic exchange field. Furthermore, the shape anisotropy can overwhelm anisotropic exchange in patterned elements with a high aspect ratio and thicker permalloy film.
UR - http://www.scopus.com/inward/record.url?scp=0011275605&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0011275605&partnerID=8YFLogxK
M3 - Article
VL - 87
SP - 4948
EP - 4950
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 9 II
ER -