Modeling on current-induced multiple domain-wall motion in permalloy nanowires

Feng Sheng Wu, Lance Horng, Yee Mou Kao, Hao Hsuan Chen, Jong Ching Wu

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We performed micromagnetic modeling on moving multiple data bits (4 to 64 bits) in permalloy nanowires and investigated the important factors affecting domain-wall movement. It was observed that current-driven multiple transverse domain walls motion (MTDWM) in cylindrical nanowires with a diameter below 20nm is characteristic of an exceptional massless mobility, which is independent of the number of bits. Besides, two phenomena are noteworthy: First, the linear velocity and the domain-wall width are closely related to the diameter of a wire. Second, the domain walls collapse when the wire diameter is more than 30 nm.

Original languageEnglish
Article number093002
JournalJapanese Journal of Applied Physics
Volume53
Issue number9
DOIs
Publication statusPublished - 2014 Jan 1

Fingerprint

Domain walls
Induced currents
Permalloys (trademark)
Nanowires
domain wall
nanowires
wire
Wire

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

@article{0ceea6f00ce94827acc326bb1410311c,
title = "Modeling on current-induced multiple domain-wall motion in permalloy nanowires",
abstract = "We performed micromagnetic modeling on moving multiple data bits (4 to 64 bits) in permalloy nanowires and investigated the important factors affecting domain-wall movement. It was observed that current-driven multiple transverse domain walls motion (MTDWM) in cylindrical nanowires with a diameter below 20nm is characteristic of an exceptional massless mobility, which is independent of the number of bits. Besides, two phenomena are noteworthy: First, the linear velocity and the domain-wall width are closely related to the diameter of a wire. Second, the domain walls collapse when the wire diameter is more than 30 nm.",
author = "Wu, {Feng Sheng} and Lance Horng and Kao, {Yee Mou} and Chen, {Hao Hsuan} and Wu, {Jong Ching}",
year = "2014",
month = "1",
day = "1",
doi = "10.7567/JJAP.53.093002",
language = "English",
volume = "53",
journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",
issn = "0021-4922",
publisher = "Japan Society of Applied Physics",
number = "9",

}

Modeling on current-induced multiple domain-wall motion in permalloy nanowires. / Wu, Feng Sheng; Horng, Lance; Kao, Yee Mou; Chen, Hao Hsuan; Wu, Jong Ching.

In: Japanese Journal of Applied Physics, Vol. 53, No. 9, 093002, 01.01.2014.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Modeling on current-induced multiple domain-wall motion in permalloy nanowires

AU - Wu, Feng Sheng

AU - Horng, Lance

AU - Kao, Yee Mou

AU - Chen, Hao Hsuan

AU - Wu, Jong Ching

PY - 2014/1/1

Y1 - 2014/1/1

N2 - We performed micromagnetic modeling on moving multiple data bits (4 to 64 bits) in permalloy nanowires and investigated the important factors affecting domain-wall movement. It was observed that current-driven multiple transverse domain walls motion (MTDWM) in cylindrical nanowires with a diameter below 20nm is characteristic of an exceptional massless mobility, which is independent of the number of bits. Besides, two phenomena are noteworthy: First, the linear velocity and the domain-wall width are closely related to the diameter of a wire. Second, the domain walls collapse when the wire diameter is more than 30 nm.

AB - We performed micromagnetic modeling on moving multiple data bits (4 to 64 bits) in permalloy nanowires and investigated the important factors affecting domain-wall movement. It was observed that current-driven multiple transverse domain walls motion (MTDWM) in cylindrical nanowires with a diameter below 20nm is characteristic of an exceptional massless mobility, which is independent of the number of bits. Besides, two phenomena are noteworthy: First, the linear velocity and the domain-wall width are closely related to the diameter of a wire. Second, the domain walls collapse when the wire diameter is more than 30 nm.

UR - http://www.scopus.com/inward/record.url?scp=84906875476&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84906875476&partnerID=8YFLogxK

U2 - 10.7567/JJAP.53.093002

DO - 10.7567/JJAP.53.093002

M3 - Article

AN - SCOPUS:84906875476

VL - 53

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 9

M1 - 093002

ER -