Modeling of a wavelet-based voltage sag monitoring system and design for the mixed-signal integrated circuit implementation

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

This paper presents a design and simulation for the voltage sag monitoring technique that intends to apply to multi-point measurement in a power transmission system. The purpose of this research is to fabricate a mixed-signal processing unit especially for power quality monitoring. The system modeling shows the framing discrete wavelet transform proves that the decision making for the voltage monitoring can be faster than the root-mean-square calculations. Also, analog integrated circuit for the data acquisition and digital integrated circuit for the discrete wavelet transform are designed and simulated in this paper. The voltage sag waveforms tested in this research project are obtained from IEEE P1159.2. They are categorized into two different cases: voltage sag caused by a single line-to-ground fault and interruption preceded by voltage sag.

Original languageEnglish
Title of host publication2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings
DOIs
Publication statusPublished - 2008 Oct 30
Event2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Chengdu, China
Duration: 2008 Apr 212008 Apr 24

Publication series

NameProceedings of the IEEE International Conference on Industrial Technology

Other

Other2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008
CountryChina
CityChengdu
Period08-04-2108-04-24

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All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Yang, W. R., Connell, R. O., Wang, C. S., & Chen, L. R. (2008). Modeling of a wavelet-based voltage sag monitoring system and design for the mixed-signal integrated circuit implementation. In 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings [4608318] (Proceedings of the IEEE International Conference on Industrial Technology). https://doi.org/10.1109/ICIT.2008.4608318