Measuring physical parameters with surface plasmon resonance heterodyne interferometry

Kun Huang Chen, Jiun You Lin, Jing Heng Chen

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

If the incident angle of a light beam on the boundary surface between the thin metal film of a surface plasmon resonance (SPR) apparatus and a test medium is equal to or very near the resonant angle, then the phase difference between the p- and s-polarizations of the reflected light is related to the associated physical parameter. The phase difference can be measured accurately with heterodyne interferometry. If the relationship between the phase difference and the associated physical parameter is specified, then the associated physical parameter can be estimated from the phase difference data. This method has the benefits of both common-path interferometry and heterodyne interferometry, such as simple structure, high stability, high resolution, easy operation, and rapid real-time measurement.

Original languageEnglish
Pages (from-to)29-34
Number of pages6
JournalOptik
Volume120
Issue number1
DOIs
Publication statusPublished - 2009 Jan 1

Fingerprint

Surface plasmon resonance
surface plasmon resonance
Interferometry
interferometry
Time measurement
metal films
light beams
Metals
time measurement
Polarization
high resolution
polarization

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Chen, Kun Huang ; Lin, Jiun You ; Chen, Jing Heng. / Measuring physical parameters with surface plasmon resonance heterodyne interferometry. In: Optik. 2009 ; Vol. 120, No. 1. pp. 29-34.
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Measuring physical parameters with surface plasmon resonance heterodyne interferometry. / Chen, Kun Huang; Lin, Jiun You; Chen, Jing Heng.

In: Optik, Vol. 120, No. 1, 01.01.2009, p. 29-34.

Research output: Contribution to journalArticle

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