Abstract
When a light coming from a circularly polarized heterodyne light source incidents on an optical material, a phase difference between s- and p- polarization components of the reflected light occurs. This phase difference can be measured accurately with the heterodyne interferometry. The measured data are substituted into the special equations derived from Fresnel equations, the refractive index can be estimated. This method bears both merits of a common-path interferometer and a heterodyne interferometer. The refractive indices of three optical glasses and two birefringent crystals were measured to show the validity of this method.
| Original language | English |
|---|---|
| Article number | 74 |
| Pages (from-to) | 882-892 |
| Number of pages | 11 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 5856 PART II |
| DOIs | |
| Publication status | Published - 2005 Dec 19 |
| Event | Optical Measurement Systems for Industrial Inspection IV - Munich, Germany Duration: 2005 Jun 13 → 2005 Jun 17 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
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Cite this
Jian, Z. C., Lin, J. Y., Hsieh, P. J., & Su, D. C. (2005). Measurements of material refractive index with a circular heterodyne interferometer. Proceedings of SPIE - The International Society for Optical Engineering, 5856 PART II, 882-892. [74]. https://doi.org/10.1117/12.612480