Measurement of two-dimensional distribution of temperature with surface plasmon resonance

Yen Chang Chu, Kun Huang Chen, Jiun You Lin, Jing Heng Chen, Huang Sen Chiu, Tsung Min Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This study proposes a simple method for measuring two-dimensional temperature distributions. Using the significant phase difference between p- and s-polarizations of the reflected light of a surface plasmon resonance (SPR) detector, the variation in the phase difference, which is caused by a variation in the temperature, can be accurately measured by phase-shifting interferometry. Then, by substituting the phase distribution into special derived equation, the temperature distribution can be determined. In order to show the feasibility of this method, different temperature distributions were measured. The measurement resolution is about 0.186°C. Due to the introduced common-path configuration and the high-sensitivity characteristic of surface plasmon resonance, this method should have merits of easy operation, high sensitivity, high accuracy and rapidly measurement.

Original languageEnglish
Title of host publicationInternational Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013
DOIs
Publication statusPublished - 2013 Aug 15
EventInternational Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013 - Singapore, Singapore
Duration: 2013 Apr 92013 Apr 11

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8769
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherInternational Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013
CountrySingapore
CitySingapore
Period13-04-0913-04-11

Fingerprint

Surface Plasmon
Surface plasmon resonance
Temperature Distribution
surface plasmon resonance
Temperature distribution
temperature distribution
Phase Difference
Phase Shifting
sensitivity
Interferometry
Temperature
temperature
High Accuracy
interferometry
Polarization
Detector
Detectors
Path
Configuration
detectors

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Chu, Y. C., Chen, K. H., Lin, J. Y., Chen, J. H., Chiu, H. S., & Chen, T. M. (2013). Measurement of two-dimensional distribution of temperature with surface plasmon resonance. In International Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013 [87692T] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8769). https://doi.org/10.1117/12.2018985
Chu, Yen Chang ; Chen, Kun Huang ; Lin, Jiun You ; Chen, Jing Heng ; Chiu, Huang Sen ; Chen, Tsung Min. / Measurement of two-dimensional distribution of temperature with surface plasmon resonance. International Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013. 2013. (Proceedings of SPIE - The International Society for Optical Engineering).
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abstract = "This study proposes a simple method for measuring two-dimensional temperature distributions. Using the significant phase difference between p- and s-polarizations of the reflected light of a surface plasmon resonance (SPR) detector, the variation in the phase difference, which is caused by a variation in the temperature, can be accurately measured by phase-shifting interferometry. Then, by substituting the phase distribution into special derived equation, the temperature distribution can be determined. In order to show the feasibility of this method, different temperature distributions were measured. The measurement resolution is about 0.186°C. Due to the introduced common-path configuration and the high-sensitivity characteristic of surface plasmon resonance, this method should have merits of easy operation, high sensitivity, high accuracy and rapidly measurement.",
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Chu, YC, Chen, KH, Lin, JY, Chen, JH, Chiu, HS & Chen, TM 2013, Measurement of two-dimensional distribution of temperature with surface plasmon resonance. in International Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013., 87692T, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8769, International Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013, Singapore, Singapore, 13-04-09. https://doi.org/10.1117/12.2018985

Measurement of two-dimensional distribution of temperature with surface plasmon resonance. / Chu, Yen Chang; Chen, Kun Huang; Lin, Jiun You; Chen, Jing Heng; Chiu, Huang Sen; Chen, Tsung Min.

International Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013. 2013. 87692T (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8769).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AU - Chiu, Huang Sen

AU - Chen, Tsung Min

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N2 - This study proposes a simple method for measuring two-dimensional temperature distributions. Using the significant phase difference between p- and s-polarizations of the reflected light of a surface plasmon resonance (SPR) detector, the variation in the phase difference, which is caused by a variation in the temperature, can be accurately measured by phase-shifting interferometry. Then, by substituting the phase distribution into special derived equation, the temperature distribution can be determined. In order to show the feasibility of this method, different temperature distributions were measured. The measurement resolution is about 0.186°C. Due to the introduced common-path configuration and the high-sensitivity characteristic of surface plasmon resonance, this method should have merits of easy operation, high sensitivity, high accuracy and rapidly measurement.

AB - This study proposes a simple method for measuring two-dimensional temperature distributions. Using the significant phase difference between p- and s-polarizations of the reflected light of a surface plasmon resonance (SPR) detector, the variation in the phase difference, which is caused by a variation in the temperature, can be accurately measured by phase-shifting interferometry. Then, by substituting the phase distribution into special derived equation, the temperature distribution can be determined. In order to show the feasibility of this method, different temperature distributions were measured. The measurement resolution is about 0.186°C. Due to the introduced common-path configuration and the high-sensitivity characteristic of surface plasmon resonance, this method should have merits of easy operation, high sensitivity, high accuracy and rapidly measurement.

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Chu YC, Chen KH, Lin JY, Chen JH, Chiu HS, Chen TM. Measurement of two-dimensional distribution of temperature with surface plasmon resonance. In International Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013. 2013. 87692T. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.2018985